XPS Study of Thermally Evaporated Ge-Sb-Te Amorphous Thin Films

Journal Article · Mon Dec 12 00:00:00 EST 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3653649· OSTI ID:21612342

Kumar, Sandeep; Singh, Digvijay; Thangaraj, R ^[1]

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1. Semiconductors Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar-143005 (India)

Amorphous thin films were prepared from the bulk composition of Ge{sub 22}Sb{sub 22}Te{sub 56}(GST) alloy by thermal evaporation in good vacuum condition. The amorphous nature of as-deposited films was checked with x-ray diffraction (XRD) studies. X-ray photoelectron spectroscopy (XPS) has been used to determine the binding energies of the core electrons in amorphous thin GST films. In XPS, we performed the survey scan from the binding energy (BE) range from 0-1100 eV and core level spectra of Ge 3d, Sb 3d and Te 3d.

• OSTI ID: 21612342
• Journal Information: AIP Conference Proceedings, Vol. 1393, Issue 1; Conference: ICACNM-2011: International conference on advances in condensed and nano materials, Chandigarh (India), 23-26 Feb 2011; Other Information: DOI: 10.1063/1.3653649; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
AMORPHOUS STATE
ANTIMONY
BINDING ENERGY
ELECTRON SPECTRA
ELECTRONS
EV RANGE
EVAPORATION
GERMANIUM
INTERMETALLIC COMPOUNDS
SEMICONDUCTOR MATERIALS
TELLURIUM
THIN FILMS
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY
ALLOYS
COHERENT SCATTERING
DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTARY PARTICLES
ELEMENTS
ENERGY
ENERGY RANGE
FERMIONS
FILMS
LEPTONS
MATERIALS
METALS
PHASE TRANSFORMATIONS
PHOTOELECTRON SPECTROSCOPY
SCATTERING
SEMIMETALS
SPECTRA
SPECTROSCOPY