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Title: Two Photon Absorption And Refraction in Bulk of the Semiconducting Materials

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3643652· OSTI ID:21612025
 [1];  [2];  [3];  [4];  [5]
  1. Department of Physics, BMIET Sonepat, Haryana (India)
  2. Department of Physics, Gurukula Kangri University, Haridwar (India)
  3. Department of Physics, DCRUST Murthal, Haryana (India)
  4. Department of Applied Physics, GJUS and T, Hisar, Haryana (India)
  5. Department of Physics, Hindu PG College (Sonepat), Haryana (India)

Fast electronic detection systems have opened up a number of new fields like nonlinear optics, optical communication, coherent optics, optical bistability, two/four wave mixing. The interest in this field has been stimulated by the importance of multiphoton processes in many fundamental aspects of physics. It has proved to be an invaluable tool for determining the optical and electronic properties of the solids because of the fact that one gets the information about the bulk of the material rather than the surface one. In this paper we report, the measurement of the nonlinear absorption and refraction from the band gap to half-band gap region of bulk of semiconductors in the direct and indirect band gap crystals with nanosecond laser. The measured theoretical calculated values of two-photon absorption coefficients ({beta}) and nonlinear refraction n{sub 2}({omega}) of direct band gap crystal match the earlier reported theoretical predictions. By making use of these theoretical calculated values, we have estimated {beta} and n{sub 2}({omega}) in the case of indirect band gap crystals. Low value of absorption coefficient in case of indirect band gap crystals have been attributed to phonon assisted transition while reduction in nonlinear refraction is due to the rise in saturation taking place in the absorption.

OSTI ID:
21612025
Journal Information:
AIP Conference Proceedings, Vol. 1391, Issue 1; Conference: OPTICS 2011: International conference on light - Optics: phenomena, materials, devices, and characterization, Calicut, Kerala (India), 23-25 May 2011; Other Information: DOI: 10.1063/1.3643652; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English