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Title: Applications of Hard X-ray Full-Field Transmission X-ray Microscopy at SSRL

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3625377· OSTI ID:21608304
; ; ;  [1];  [1];  [2];  [3];  [4]
  1. Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, CA 94025 (United States)
  2. CIEMAT, Avda Complutense 22, MADRID 28040 (Spain)
  3. CEMES (UPR 8011 CNRS), 29 rue J. Marvig, 31055 Toulouse Cedex 4 (France)
  4. Institute for National Measurement Standards, National Research Council, Ottawa ON K1A0R6 (Canada)

State-of-the-art hard x-ray full-field transmission x-ray microscopy (TXM) at beamline 6-2C of Stanford Synchrotron Radiation Lightsource has been applied to various research fields including biological, environmental, and material studies. With the capability of imaging a 32-micron field-of-view at 30-nm resolution using both absorption mode and Zernike phase contrast, the 3D morphology of yeast cells grown in gold-rich media was investigated. Quantitative evaluation of the absorption coefficient was performed for mercury nanoparticles in alfalfa roots exposed to mercury. Combining XANES and TXM, we also performed XANES-imaging on an ancient pottery sample from the Roman pottery workshop at LaGraufesenque (Aveyron).

OSTI ID:
21608304
Journal Information:
AIP Conference Proceedings, Vol. 1365, Issue 1; Conference: 10. international conference on X-ray microscopy, Chicago, IL (United States), 15-20 Aug 2010; Other Information: DOI: 10.1063/1.3625377; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English