Neutron Coherent Scattering Length Determination With a Dual Non-Dispersive Sample

Journal Article · Fri Jul 15 00:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3605953· OSTI ID:21608162

Abbas, Sohrab; Wagh, Apoorva G ^[1]; Loidl, R; Lemmel, H; Rauch, H ^[2]

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1. Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India)
2. Atominstitut der Oesterreichischen Universitaeten, 1020 Wien (Austria)

We report here a preliminary interferometric determination of neutron coherent scattering length b{sub C} for silicon using a dual non-dispersive sample. A large and exactly non-dispersive phase measured by this method can afford an order of magnitude improvement in the precision of b{sub C} determination to within a few parts in 10{sup 6}.

• OSTI ID: 21608162
• Journal Information: AIP Conference Proceedings, Vol. 1349, Issue 1; Conference: 55. DAE solid state physics symposium 2010, Manipal (India), 26-30 Dec 2010; Other Information: DOI: 10.1063/1.3605953; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
ACCURACY
COHERENT SCATTERING
MONOCHROMATORS
OPTIMIZATION
PHASE STABILITY
PHASE STUDIES
SCATTERING LENGTHS
SILICON
DIMENSIONS
ELEMENTS
LENGTH
SCATTERING
SEMIMETALS
STABILITY