Photonic structures and their application for measuring material parameters
Abstract
A computer simulation and an experimental study of the frequency dependences of the transmission coefficients of photonic crystals are carried out on the basis of microstrip lines with distortion in their periodicity in the form of change in the microstrip dimensions and the permittivity of a substrate of one of the alternate pieces of the microstrip line in the range of 0-20 GHz. Good quantitative agreement between the results of calculations and experimental data is obtained. It is shown that there is a possibility of using open microwave transmission lines, namely, microstrip photonic structures, to implement a method for measuring the parameters of material samples with the specified geometrical shape and a certain size that perform a function of nonuniformity in the photonic structure.
- Authors:
-
- Saratov State University (Russian Federation)
- Publication Date:
- OSTI Identifier:
- 21562381
- Resource Type:
- Journal Article
- Journal Name:
- Semiconductors
- Additional Journal Information:
- Journal Volume: 43; Journal Issue: 13; Other Information: DOI: 10.1134/S1063782609130132; Copyright (c) 2009 Pleiades Publishing, Ltd.; Journal ID: ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; COMPUTERIZED SIMULATION; CRYSTALS; EXPERIMENTAL DATA; FREQUENCY DEPENDENCE; GHZ RANGE; MICROWAVE RADIATION; PERIODICITY; PERMITTIVITY; POWER TRANSMISSION LINES; SHAPE; SUBSTRATES; TRANSMISSION; DATA; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; FREQUENCY RANGE; INFORMATION; NUMERICAL DATA; PHYSICAL PROPERTIES; RADIATIONS; SIMULATION; VARIATIONS
Citation Formats
Usanov, D. A., E-mail: UsanovDA@info.sgu.ru, Skripal', A V, Abramov, A V, Bogolyubov, A S, and Kulikov, M Yu. Photonic structures and their application for measuring material parameters. United States: N. p., 2009.
Web. doi:10.1134/S1063782609130132.
Usanov, D. A., E-mail: UsanovDA@info.sgu.ru, Skripal', A V, Abramov, A V, Bogolyubov, A S, & Kulikov, M Yu. Photonic structures and their application for measuring material parameters. United States. https://doi.org/10.1134/S1063782609130132
Usanov, D. A., E-mail: UsanovDA@info.sgu.ru, Skripal', A V, Abramov, A V, Bogolyubov, A S, and Kulikov, M Yu. 2009.
"Photonic structures and their application for measuring material parameters". United States. https://doi.org/10.1134/S1063782609130132.
@article{osti_21562381,
title = {Photonic structures and their application for measuring material parameters},
author = {Usanov, D. A., E-mail: UsanovDA@info.sgu.ru and Skripal', A V and Abramov, A V and Bogolyubov, A S and Kulikov, M Yu},
abstractNote = {A computer simulation and an experimental study of the frequency dependences of the transmission coefficients of photonic crystals are carried out on the basis of microstrip lines with distortion in their periodicity in the form of change in the microstrip dimensions and the permittivity of a substrate of one of the alternate pieces of the microstrip line in the range of 0-20 GHz. Good quantitative agreement between the results of calculations and experimental data is obtained. It is shown that there is a possibility of using open microwave transmission lines, namely, microstrip photonic structures, to implement a method for measuring the parameters of material samples with the specified geometrical shape and a certain size that perform a function of nonuniformity in the photonic structure.},
doi = {10.1134/S1063782609130132},
url = {https://www.osti.gov/biblio/21562381},
journal = {Semiconductors},
issn = {1063-7826},
number = 13,
volume = 43,
place = {United States},
year = {Tue Dec 15 00:00:00 EST 2009},
month = {Tue Dec 15 00:00:00 EST 2009}
}