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Title: Subwavelength optical microscopy in the far field

Journal Article · · Physical Review. A
;  [1];  [2];  [1]
  1. Department of Physics and Institute of Quantum Studies, Texas A and M University, College Station, Texas 77843 (United States)
  2. The National Centre for Mathematics and Physics, KACST, P.O. Box 6086, Riyadh 11442 (Saudi Arabia)

We present a procedure for subwavelength optical microscopy. The identical atoms are distributed on a plane and shined with a standing wave. We rotate the plane to different angles and record the resonant fluorescence spectra in the far field, from which we can obtain their distance and location information. This procedure also works for atomic separation above one wavelength and therefore provides a seamless microscopy.

OSTI ID:
21550199
Journal Information:
Physical Review. A, Vol. 83, Issue 6; Other Information: DOI: 10.1103/PhysRevA.83.063818; (c) 2011 American Institute of Physics; ISSN 1050-2947
Country of Publication:
United States
Language:
English