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Title: Electron back scattered diffraction characterization of Sm(CoFeCuZr){sub z} magnets

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3565417· OSTI ID:21538257
; ;  [1];  [2]
  1. National Institute of Metrology, Standardization and Industrial Quality, Duque de Caxias, Rio de Janeiro 25250-020 (Brazil)
  2. Centro de Ciencias Exatas e Tecnologia, Universidade de Caxias do Sul, Caxias do Sul, Rio Grande do Sul 95070-560 (Brazil)

In permanent magnets based on the Sm{sub 2}Co{sub 17} phase, the high coercivity depends on the presence of a complex microstructure, consisting of a Sm{sub 2}(Co,Fe){sub 17} cell phase, a cell boundary phase Sm(Co,Cu){sub 5}, and a Zr-rich platelet or lamellae phase. The aim of this work is to use electron back scatter diffraction (EBSD) in order to identify the different phases present in the isotropic magnets produced from cast alloys with the composition of Sm(Co{sub bal}Fe{sub 0.2}Cu{sub 0.1}Zr{sub x}){sub 8}, where x = 0, 0.02, or 0.06, and correlate them with the different phases observed in scanning electron microscopy (SEM) images. Due to the combination of careful surface preparation and high resolution microscopy, it was possible to observe the cellular structure characteristic of the 2:17 magnets in the SEM images. Until now, only transmission electron microscopy (TEM) had been used. Composition maps, energy dispersive spectroscopy (EDS), and EBSD measurements were used for doing the phase identification.

OSTI ID:
21538257
Journal Information:
Journal of Applied Physics, Vol. 109, Issue 7; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: DOI: 10.1063/1.3565417; (c) 2011 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English