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Title: Positron Annihilation Spectroscopy Of High Performance Polymer Films Under CO{sub 2} Pressure

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3586153· OSTI ID:21513409
 [1]; ;  [2];  [3]
  1. Texas Christian University, Fort Worth TX 76109 (United States)
  2. Idaho National Laboratory, Idaho Falls ID 83415-2208 (United States)
  3. Pajarito Scientific Corporation, Idaho Falls ID 83404 (United States)

Positron annihilation Lifetime and Doppler broadening measurements are reported for six polymer films as a function of carbon dioxide (CO{sub 2}) absolute pressure ranging from 0 to 45 psi. Since the polymer films were thin and did not absorb all positrons, corrections were made in the lifetime analysis for the absorption of positrons in the positron source and sample holder using the Monte Carlo transport code MCNP. The studied polymers are found to behave differently from each other. Some polymers form positronium and others, such as the polyimide structures, do not. For those polymers that form positronium an interpretation in terms of free volume is possible; for those that don't form positronium, further work is needed to determine how best to describe the behavior in terms of the bulk positron annihilation parameters. A few of the studied polymers exhibit changes in positron lifetime and intensity under CO{sub 2} pressure which may be described by the Henry or Langmuir sorption models, while the positron response of other polymers is rather insensitive to the CO{sub 2} pressure. The results demonstrate the usefulness of positron annihilation spectroscopy in investigating the sorption of CO{sub 2} into various polymers at pressures up to about 3 atm (45psi).

OSTI ID:
21513409
Journal Information:
AIP Conference Proceedings, Vol. 1336, Issue 1; Conference: CAARI 2010: 21. International Conference on the Application of Accelerators in Research and Industry, Fort Worth, TX (United States), 8-13 Aug 2010; Other Information: DOI: 10.1063/1.3586153; (c) 2011 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English