Directional x-ray dark-field imaging of strongly ordered systems
Journal Article
·
· Physical Review. B, Condensed Matter and Materials Physics
- Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen (Denmark)
- Department of Physics, Technical University of Munich, 85747 Garching (Germany)
- European Synchrotron Radiation Facility, 38043 Grenoble (France)
- Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)
- Biomaterials Science Center, University of Basel, 4031 Basel (Switzerland)
- Karlsruhe Institute of Technology, Institute for Microstructure Technology, 76021 Karlsruhe (Germany)
Recently a novel grating based x-ray imaging approach called directional x-ray dark-field imaging was introduced. Directional x-ray dark-field imaging yields information about the local texture of structures smaller than the pixel size of the imaging system. In this work we extend the theoretical description and data processing schemes for directional dark-field imaging to strongly scattering systems, which could not be described previously. We develop a simple scattering model to account for these recent observations and subsequently demonstrate the model using experimental data. The experimental data includes directional dark-field images of polypropylene fibers and a human tooth slice.
- OSTI ID:
- 21502904
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 82, Issue 21; Other Information: DOI: 10.1103/PhysRevB.82.214103; (c) 2010 The American Physical Society; ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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