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Title: Stabilization of Th{sup 3+} ions into mixed-valence thorium fluoride

Journal Article · · Journal of Solid State Chemistry
 [1]; ; ; ;  [1];  [2];  [1]
  1. Clermont Universite, Universite Blaise Pascal, Laboratoire des Materiaux Inorganiques, BP 10448, F-63000 Clermont-Ferrand (France)
  2. Clermont Universite, ENSCCF, Laboratoire des Materiaux Inorganiques, BP 10448, F-63000 Clermont-Ferrand (France)

The unusual oxidation state +3 of the thorium has been stabilized into a lithium containing non-stoichiometric mixed-valence (III/IV) thorium fluorinated phase with formula Li{sub 2+x}Th{sub 12}F{sub 50} (0<x<1.8). This phase is closely related to the Li{sub 5.5}Ce{sub 12}F{sub 50} one, the structure of which has been determined from the combined single-crystal X-ray diffraction and high resolution synchrotron powder diffraction. In these phases, the Li{sup +} ions can be divided into two groups and are located either in locked positions or in open channels of the three dimensional framework. The amount of Li{sup +} ions in open channels can be variable, so that the afore mentioned single phase may be considered as an insertion compound. The Li{sup +} insertion is accompanied by the simultaneous reduction of a part of the Th{sup 4+} ions, resulting in a mixed-valence III/IV thorium fluoride. The electrochemical insertion of Li{sup +} ions into the open channels of the host matrix has been carried out at 60 {sup o}C, using an alkylcarbonate PC-LiClO{sub 4} 1 M electrolyte. The Li{sup +} and Th{sup 3+} contents, both in the starting composition and the Li{sup +} inserted ones, were investigated by high resolution solid state {sup 7}Li NMR and EPR, respectively. -- Graphical abstract: Electrochemical insertion of Li{sup +} ions into mixed-valence III/IV thorium fluoride and EPR spectra for the raw and inserted compounds. Display Omitted

OSTI ID:
21494189
Journal Information:
Journal of Solid State Chemistry, Vol. 184, Issue 1; Other Information: DOI: 10.1016/j.jssc.2010.10.010; PII: S0022-4596(10)00464-0; Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
Country of Publication:
United States
Language:
English