skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Development of Micron-Resolved Electron Spectroscopy to Study Organic Thin Films in Real Devices

Abstract

A straightforward application of an electron energy analyzer equipped with an image detector to micron-resolved electron spectroscopic studies of organic thin film devices is reported. The electron spectroscopies implemented include synchrotron-based UPS, XPS, and Auger yield NEXAFS. Along the non-energy-dispersion direction of the analyzer, a spatial resolution of {approx}40 {mu}m is obtained through the employment of entrance slits, electrostatic lenses and segmented CCD detector. One significant benefit offered by the technique is that the electronic transport and electronic structure of the same micron-sized sample can be directly examined. The example illustrated is a top-contact organic field effect transistor (OFET) fabricated from semiconducting triethylsilylethynyl anthradithiophene and gold electrodes. It is found that an extensive out-diffusion of gold atoms to adjacent conduction channels takes place, presumably due to the inability of soft organic materials in dissipating the excess energy with which gaseous Au atoms possess.

Authors:
;  [1];  [1]; ;  [2];  [3]
  1. National Synchrotron Radiation Research Center, Hsinchu, Taiwan 30076 (China)
  2. Department of Chemistry, National Tsing-Hua University, Hsinchu, Taiwan 30013 (China)
  3. Department of Chemistry, National Central University, Jhongli, Taiwan 32001 (China)
Publication Date:
OSTI Identifier:
21431072
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1234; Journal Issue: 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463242; (c) 2010 American Institute of Physics; Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION SPECTROSCOPY; ATOMS; CHARGE-COUPLED DEVICES; DIFFUSION; DISPERSIONS; ELECTRONIC STRUCTURE; ELECTRONS; ELECTROSTATIC LENSES; FIELD EFFECT TRANSISTORS; FINE STRUCTURE; GOLD; SPATIAL RESOLUTION; SYNCHROTRONS; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY; ACCELERATORS; CYCLIC ACCELERATORS; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; LENSES; LEPTONS; METALS; PHOTOELECTRON SPECTROSCOPY; RESOLUTION; SEMICONDUCTOR DEVICES; SPECTROSCOPY; TRANSISTORS; TRANSITION ELEMENTS

Citation Formats

Wang, C -H, Fan, L -J, Yang, Y -W, Department of Chemistry, National Tsing-Hua University, Hsinchu, Taiwan 30013, Su, J -W, Chan, S -W, and Chen, M -C. Development of Micron-Resolved Electron Spectroscopy to Study Organic Thin Films in Real Devices. United States: N. p., 2010. Web. doi:10.1063/1.3463242.
Wang, C -H, Fan, L -J, Yang, Y -W, Department of Chemistry, National Tsing-Hua University, Hsinchu, Taiwan 30013, Su, J -W, Chan, S -W, & Chen, M -C. Development of Micron-Resolved Electron Spectroscopy to Study Organic Thin Films in Real Devices. United States. https://doi.org/10.1063/1.3463242
Wang, C -H, Fan, L -J, Yang, Y -W, Department of Chemistry, National Tsing-Hua University, Hsinchu, Taiwan 30013, Su, J -W, Chan, S -W, and Chen, M -C. 2010. "Development of Micron-Resolved Electron Spectroscopy to Study Organic Thin Films in Real Devices". United States. https://doi.org/10.1063/1.3463242.
@article{osti_21431072,
title = {Development of Micron-Resolved Electron Spectroscopy to Study Organic Thin Films in Real Devices},
author = {Wang, C -H and Fan, L -J and Yang, Y -W and Department of Chemistry, National Tsing-Hua University, Hsinchu, Taiwan 30013 and Su, J -W and Chan, S -W and Chen, M -C},
abstractNote = {A straightforward application of an electron energy analyzer equipped with an image detector to micron-resolved electron spectroscopic studies of organic thin film devices is reported. The electron spectroscopies implemented include synchrotron-based UPS, XPS, and Auger yield NEXAFS. Along the non-energy-dispersion direction of the analyzer, a spatial resolution of {approx}40 {mu}m is obtained through the employment of entrance slits, electrostatic lenses and segmented CCD detector. One significant benefit offered by the technique is that the electronic transport and electronic structure of the same micron-sized sample can be directly examined. The example illustrated is a top-contact organic field effect transistor (OFET) fabricated from semiconducting triethylsilylethynyl anthradithiophene and gold electrodes. It is found that an extensive out-diffusion of gold atoms to adjacent conduction channels takes place, presumably due to the inability of soft organic materials in dissipating the excess energy with which gaseous Au atoms possess.},
doi = {10.1063/1.3463242},
url = {https://www.osti.gov/biblio/21431072}, journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1234,
place = {United States},
year = {Wed Jun 23 00:00:00 EDT 2010},
month = {Wed Jun 23 00:00:00 EDT 2010}
}