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Title: Kramers-Kronig Analysis of Infrared Reflectance Spectra for Quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N Alloy

Abstract

In this paper, a Kramers-Kronig (KK) analysis of infrared (IR) reflectance spectrum of quaternary In{sub 0.01}Al{sub 0.06}Ga{sub 0.93}N film grown by molecular beam epitaxy (MBE) is reported. The infrared measurement is performed in the reflection mode at an incident angle of 15 degree sign by Fourier transform infrared (FTIR) spectroscopy at T = 300 K. The Kramers-Kronig analysis of the reflectivity data has been used to obtain the real and imaginary parts of the index of refraction (n and k), and the real and imaginary parts of the dielectric response function ({epsilon}' and {epsilon}') of the materials. Finally, the transverse optical and longitudinal optical phonons for quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N were obtained.

Authors:
; ; ;  [1]
  1. Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800 Penang (Malaysia)
Publication Date:
OSTI Identifier:
21415268
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1250; Journal Issue: 1; Conference: PERFIK2009: National physics conference 2009, Malacca (Malaysia), 7-9 Dec 2009; Other Information: DOI: 10.1063/1.3469673; (c) 2010 American Institute of Physics; Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; ALUMINIUM ALLOYS; DIELECTRIC MATERIALS; FILMS; FOURIER TRANSFORM SPECTROMETERS; GALLIUM ALLOYS; INDIUM ALLOYS; INFRARED SPECTRA; KRAMERS-KRONIG CORRELATION; MOLECULAR BEAM EPITAXY; NITROGEN COMPOUNDS; PHONONS; QUATERNARY ALLOY SYSTEMS; REFLECTION; REFLECTIVITY; REFRACTIVE INDEX; RESPONSE FUNCTIONS; ALLOY SYSTEMS; ALLOYS; CORRELATIONS; CRYSTAL GROWTH METHODS; EPITAXY; FUNCTIONS; MATERIALS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; QUASI PARTICLES; SPECTRA; SPECTROMETERS; SPECTROSCOPY; SURFACE PROPERTIES

Citation Formats

Raof, N H. Abd., Ng, S S, Hassan, H Abu, and Hassan, Z. Kramers-Kronig Analysis of Infrared Reflectance Spectra for Quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N Alloy. United States: N. p., 2010. Web. doi:10.1063/1.3469673.
Raof, N H. Abd., Ng, S S, Hassan, H Abu, & Hassan, Z. Kramers-Kronig Analysis of Infrared Reflectance Spectra for Quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N Alloy. United States. https://doi.org/10.1063/1.3469673
Raof, N H. Abd., Ng, S S, Hassan, H Abu, and Hassan, Z. 2010. "Kramers-Kronig Analysis of Infrared Reflectance Spectra for Quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N Alloy". United States. https://doi.org/10.1063/1.3469673.
@article{osti_21415268,
title = {Kramers-Kronig Analysis of Infrared Reflectance Spectra for Quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N Alloy},
author = {Raof, N H. Abd. and Ng, S S and Hassan, H Abu and Hassan, Z},
abstractNote = {In this paper, a Kramers-Kronig (KK) analysis of infrared (IR) reflectance spectrum of quaternary In{sub 0.01}Al{sub 0.06}Ga{sub 0.93}N film grown by molecular beam epitaxy (MBE) is reported. The infrared measurement is performed in the reflection mode at an incident angle of 15 degree sign by Fourier transform infrared (FTIR) spectroscopy at T = 300 K. The Kramers-Kronig analysis of the reflectivity data has been used to obtain the real and imaginary parts of the index of refraction (n and k), and the real and imaginary parts of the dielectric response function ({epsilon}' and {epsilon}') of the materials. Finally, the transverse optical and longitudinal optical phonons for quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N were obtained.},
doi = {10.1063/1.3469673},
url = {https://www.osti.gov/biblio/21415268}, journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1250,
place = {United States},
year = {Wed Jul 07 00:00:00 EDT 2010},
month = {Wed Jul 07 00:00:00 EDT 2010}
}