Microstructure versus Size: Mechanical Properties of Electroplated Single Crystalline Cu Nanopillars

Journal Article · Fri Apr 02 00:00:00 EDT 2010 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.104.135503· OSTI ID:21410620

Jennings, Andrew T; Greer, Julia R ^[1]; Burek, Michael J ^[2]

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1. Engineering and Applied Sciences, California Institute of Technology, 1200 East California Boulevard, Pasadena, California 91125 (United States)
2. University of Waterloo, 200 University Avenue West, Waterloo, ON N2L 3G1 (Canada)

We report results of uniaxial compression experiments on single-crystalline Cu nanopillars with nonzero initial dislocation densities produced without focused ion beam (FIB). Remarkably, we find the same power-law size-driven strengthening as FIB-fabricated face-centered cubic micropillars. TEM analysis reveals that initial dislocation density in our FIB-less pillars and those produced by FIB are on the order of 10{sup 14} m{sup -2} suggesting that mechanical response of nanoscale crystals is a stronger function of initial microstructure than of size regardless of fabrication method.

• OSTI ID: 21410620
• Journal Information: Physical Review Letters, Vol. 104, Issue 13; Other Information: DOI: 10.1103/PhysRevLett.104.135503; (c) 2010 The American Physical Society; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COMPRESSION
COPPER
DENSITY
DISLOCATIONS
ELECTROPLATING
FCC LATTICES
ION BEAMS
MECHANICAL PROPERTIES
MICROSTRUCTURE
MONOCRYSTALS
NANOSTRUCTURES
TRANSMISSION ELECTRON MICROSCOPY
BEAMS
CRYSTAL DEFECTS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTALS
CUBIC LATTICES
DEPOSITION
ELECTRODEPOSITION
ELECTROLYSIS
ELECTRON MICROSCOPY
ELEMENTS
LINE DEFECTS
LYSIS
METALS
MICROSCOPY
PHYSICAL PROPERTIES
PLATING
SURFACE COATING
TRANSITION ELEMENTS