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Title: Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3463334· OSTI ID:21410340
;  [1];  [2];  [3];  [4];  [5];  [6]; ;  [7]
  1. Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laborator, 2575 Sand Hill Rd, Menlo Park CA 94025 (United States)
  2. Atomic Institute of the Austrian Universities, Vienna University of Technology, Vienna (Austria)
  3. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei (China)
  4. NASA Ames Research Center, Moffett Field CA 94035 (United States)
  5. Department of Aeronautics and Astronautics, Stanford University, Stanford CA 94305 (United States)
  6. Department of Biological Science, San Jose State University, San Jose CA 95192 (United States)
  7. Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305 (United States)

A hard X-ray full field microscope from Xradia Inc. has been installed at SSRL on a 54-pole wiggler end station at beam line 6-2. It has been optimized to operate from 5-14 keV with resolution as high as 30 nm. High quality images are achieved using a vertical beam stabilizer and condenser scanner with high efficiency zone plates with 30 nm outermost zone width. The microscope has been used in Zernike phase contrast, available at 5.4 keV and 8 keV, as well as absorption contrast to image a variety of biological, environmental and materials samples. Calibration of the X-ray attenuation with crystalline apatite enabled quantification of bone density of plate-like and rod-like regions of mouse bone trabecula. 3D tomography of individual lacuna revealed the surrounding cell canaliculi and processes. 3D tomography of chiral branched PbSe nanowires showed orthogonal branches around a central nanowire.

OSTI ID:
21410340
Journal Information:
AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463334; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English