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Title: Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination

Abstract

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2x2x2 {mu}m{sup 3} cytidine, 600x600x300 nm{sup 3} BaTiO{sub 3}, and 1x1x1 {mu}m{sup 3} silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendelloesung method and do not require absorption and extinction corrections.

Authors:
; ;  [1];  [2];  [1]
  1. Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Sayo, Hyogo 679-5198 (Japan)
  2. Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075 (Japan)
Publication Date:
OSTI Identifier:
21410217
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1234; Journal Issue: 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463161; (c) 2010 American Institute of Physics; Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION; ACCURACY; BARIUM COMPOUNDS; CORRECTIONS; CYTIDINE; DIFFRACTOMETERS; GONIOMETERS; MONOCRYSTALS; OPTICS; PLATES; SILICON; SPRING-8 STORAGE RING; STRUCTURE FACTORS; SYNCHROTRON RADIATION; TITANATES; X RADIATION; ALKALINE EARTH METAL COMPOUNDS; AZINES; BREMSSTRAHLUNG; CRYSTALS; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; ELEMENTS; HETEROCYCLIC COMPOUNDS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NUCLEOSIDES; NUCLEOTIDES; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; PYRIMIDINES; RADIATION SOURCES; RADIATIONS; RIBOSIDES; SEMIMETALS; SORPTION; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Citation Formats

Yasuda, Nobuhiro, Fukuyama, Yoshimitsu, Kimura, Shigeru, Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075, Toriumi, Koshiro, University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Takata, Masaki, Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075, and RIKEN SPring-8 Center, Harima Institute, 1-1-1 Kouto, Sayo, Sayo, Hyogo 679-5148. Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination. United States: N. p., 2010. Web. doi:10.1063/1.3463161.
Yasuda, Nobuhiro, Fukuyama, Yoshimitsu, Kimura, Shigeru, Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075, Toriumi, Koshiro, University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Takata, Masaki, Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075, & RIKEN SPring-8 Center, Harima Institute, 1-1-1 Kouto, Sayo, Sayo, Hyogo 679-5148. Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination. United States. https://doi.org/10.1063/1.3463161
Yasuda, Nobuhiro, Fukuyama, Yoshimitsu, Kimura, Shigeru, Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075, Toriumi, Koshiro, University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Takata, Masaki, Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075, and RIKEN SPring-8 Center, Harima Institute, 1-1-1 Kouto, Sayo, Sayo, Hyogo 679-5148. 2010. "Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination". United States. https://doi.org/10.1063/1.3463161.
@article{osti_21410217,
title = {Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination},
author = {Yasuda, Nobuhiro and Fukuyama, Yoshimitsu and Kimura, Shigeru and Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075 and Toriumi, Koshiro and University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297 and Takata, Masaki and Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075 and RIKEN SPring-8 Center, Harima Institute, 1-1-1 Kouto, Sayo, Sayo, Hyogo 679-5148},
abstractNote = {Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2x2x2 {mu}m{sup 3} cytidine, 600x600x300 nm{sup 3} BaTiO{sub 3}, and 1x1x1 {mu}m{sup 3} silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendelloesung method and do not require absorption and extinction corrections.},
doi = {10.1063/1.3463161},
url = {https://www.osti.gov/biblio/21410217}, journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1234,
place = {United States},
year = {Wed Jun 23 00:00:00 EDT 2010},
month = {Wed Jun 23 00:00:00 EDT 2010}
}