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Title: The New Maia Detector System: Methods For High Definition Trace Element Imaging Of Natural Material

Motivated by the need for megapixel high definition trace element imaging to capture intricate detail in natural material, together with faster acquisition and improved counting statistics in elemental imaging, a large energy-dispersive detector array called Maia has been developed by CSIRO and BNL for SXRF imaging on the XFM beamline at the Australian Synchrotron. A 96 detector prototype demonstrated the capacity of the system for real-time deconvolution of complex spectral data using an embedded implementation of the Dynamic Analysis method and acquiring highly detailed images up to 77 M pixels spanning large areas of complex mineral sample sections.
Authors:
 [1] ;  [2] ;  [2] ; ;  [3] ; ; ; ; ;  [1] ;  [1] ;  [2] ;  [4] ; ; ;  [5] ;  [6]
  1. CSIRO, Bayview Avenue, Clayton VIC 3168 (Australia)
  2. (Australia)
  3. National Synchrotron Light Source, Brookhaven National Laboratory, NY (United States)
  4. Instrumentation Division, Brookhaven National Laboratory, Brookhaven NY (United States)
  5. Australian Synchrotron, Clayton VIC (Australia)
  6. Department of Physics, La Trobe University, VIC (Australia)
Publication Date:
OSTI Identifier:
21371776
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1221; Journal Issue: 1; Conference: 20. international congress on X-ray optics and microanalysis, Karlsruhe (Germany), 15-18 Sep 2009; Other Information: DOI: 10.1063/1.3399266; (c) 2010 American Institute of Physics
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; IMAGES; IMPLEMENTATION; MICROSCOPY; MINERALS; MULTI-ELEMENT ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; SEMICONDUCTOR DETECTORS; TRACE AMOUNTS; X-RAY DETECTION; X-RAY FLUORESCENCE ANALYSIS CHEMICAL ANALYSIS; DETECTION; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RADIATION DETECTORS; X-RAY EMISSION ANALYSIS