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Title: Interfacial Studies of Sized Carbon Fiber

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3377869· OSTI ID:21371691
; ; ;  [1]
  1. Nanomaterials Program, Advance Materials Centre (AMREC), SIRIM Berhad, Lot 34, Jalan Hi-Tech Park, 09000, Kulim, Kedah (Malaysia)

This study was performed to investigate the influence of sizing treatment on carbon fiber in respect of interfacial adhesion in composite materials, Epolam registered 2025. Fortafil unsized carbon fiber was used to performed the experiment. The fiber was commercially surface treated and it was a polyacrylonitrile based carbon fiber with 3000 filament per strand. Epicure registered 3370 was used as basic sizing chemical and dissolved in two types of solvent, ethanol and acetone for the comparison purpose. The single pull out test has been used to determine the influence of sizing on carbon fiber. The morphology of carbon fiber was observed by atomic force microscopy (AFM) and scanning electron microscopy (SEM). The apparent interfacial strength IFSS values determined by pull out test for the Epicure registered 3370/ethanol sized carbon fiber pointed to a good interfacial behaviour compared to the Epicure registered 3370/acetone sized carbon fiber. The Epicure registered 3370/ethanol sizing agent was found to be effective in promoting adhesion because of the chemical reactions between the sizing and Epolam registered 2025 during the curing process. From this work, it showed that sized carbon fiber using Epicure registered 3370 with addition of ethanol give higher mechanical properties of carbon fiber in terms of shear strength and also provided a good adhesion between fiber and matrix compared to the sizing chemical that contain acetone as a solvent.

OSTI ID:
21371691
Journal Information:
AIP Conference Proceedings, Vol. 1217, Issue 1; Conference: ICAMN-2007: International conference on advancement of materials and nanotechnology, Langkawi, Kedah (Malaysia), 29 May - 1 Jun 2007; Other Information: DOI: 10.1063/1.3377869; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English