Radiation-Induced Premelting of Ice at Silica Interfaces

Journal Article · Fri Aug 28 00:00:00 EDT 2009 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.103.095502· OSTI ID:21364656

Schoeder, S ^[1]; Reichert, H; Schroeder, H; Mezger, M; Okasinski, J S; Dosch, H ^[1]; Honkimaeki, V ^[2]; Bilgram, J ^[3]

---

1. Max-Planck-Institut fuer Metallforschung, Heisenbergstrasse 3, 70569 Stuttgart (Germany)
2. European Synchrotron Radiation Facility (ESRF), 38043 Grenoble (France)
3. Laboratorium fuer Festkoerperphysik, ETH Zuerich, 8093 Zuerich (Switzerland)

The existence of surface and interfacial melting of ice below 0 deg. C has been confirmed by many different experimental techniques. Here we present a high-energy x-ray reflectivity study of the interfacial melting of ice as a function of both temperature and x-ray irradiation dose. We found a clear increase of the thickness of the quasiliquid layer with the irradiation dose. By a systematic x-ray study, we have been able to unambiguously disentangle thermal and radiation-induced premelting phenomena. We also confirm the previously announced very high water density (1.25 g/cm{sup 3}) within the emerging quasiliquid layer.

• OSTI ID: 21364656
• Journal Information: Physical Review Letters, Vol. 103, Issue 9; Other Information: DOI: 10.1103/PhysRevLett.103.095502; (c) 2009 The American Physical Society; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ICE
LAYERS
MELTING
RADIATION DOSES
REFLECTIVITY
SILICA
DOSES
MINERALS
OPTICAL PROPERTIES
OXIDE MINERALS
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
SURFACE PROPERTIES