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Title: Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface

Abstract

We compare the three-dimensional force field obtained from frequency-distance measurements above the NaCl(001) surface to atomistic calculations using various tip models. In the experiments, long-range forces cause a total attractive force even on the similarly charged site. Taking force differences between two sites minimizes the influence of such long-range forces. The magnitude of the measured force differences are by a factor of 6.5-10 smaller than the calculated forces. This is an indication that for the particular tip used in this experiment several atoms of the tip interact with the surface atoms at close tip-sample distances. The interaction of these additional atoms with the surface is small at the imaging distance, because symmetric images are obtained. The force distance characteristics resemble those of a negative tip apex ion which could be explained, e.g., by a neutral Si tip.

Authors:
 [1]; ;  [2];  [3]
  1. Physikalisches Institut and DFG Center for Functional Nanostructures (CFN), Universitaet Karlsruhe, D-76128 Karlsruhe (Germany)
  2. Physikalisches Institut, Westfaelische Wilhelms-Universitaet Muenster, Wilhelm-Klemm-Strasse 10, 48149 Muenster (Germany)
  3. Department of Applied Physics, Helsinki University of Technology, P.O. Box 1100, Helsinki 02015 (Finland)
Publication Date:
OSTI Identifier:
21287071
Resource Type:
Journal Article
Journal Name:
Physical Review. B, Condensed Matter and Materials Physics
Additional Journal Information:
Journal Volume: 80; Journal Issue: 11; Other Information: DOI: 10.1103/PhysRevB.80.115426; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1098-0121
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC FORCE MICROSCOPY; ATOMS; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CRYSTAL LATTICES; DISTANCE; INTERACTIONS; IONS; SODIUM CHLORIDES; SURFACES; SYMMETRY; THREE-DIMENSIONAL CALCULATIONS

Citation Formats

Hoffmann, R, Weiner, D, Schirmeisen, A, Center for Nanotechnology, Foster, A S, and Department of Physics, Tampere University of Technology, P.O. Box 692, Tampere 33101. Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface. United States: N. p., 2009. Web. doi:10.1103/PHYSREVB.80.115426.
Hoffmann, R, Weiner, D, Schirmeisen, A, Center for Nanotechnology, Foster, A S, & Department of Physics, Tampere University of Technology, P.O. Box 692, Tampere 33101. Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface. United States. https://doi.org/10.1103/PHYSREVB.80.115426
Hoffmann, R, Weiner, D, Schirmeisen, A, Center for Nanotechnology, Foster, A S, and Department of Physics, Tampere University of Technology, P.O. Box 692, Tampere 33101. 2009. "Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface". United States. https://doi.org/10.1103/PHYSREVB.80.115426.
@article{osti_21287071,
title = {Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface},
author = {Hoffmann, R and Weiner, D and Schirmeisen, A and Center for Nanotechnology and Foster, A S and Department of Physics, Tampere University of Technology, P.O. Box 692, Tampere 33101},
abstractNote = {We compare the three-dimensional force field obtained from frequency-distance measurements above the NaCl(001) surface to atomistic calculations using various tip models. In the experiments, long-range forces cause a total attractive force even on the similarly charged site. Taking force differences between two sites minimizes the influence of such long-range forces. The magnitude of the measured force differences are by a factor of 6.5-10 smaller than the calculated forces. This is an indication that for the particular tip used in this experiment several atoms of the tip interact with the surface atoms at close tip-sample distances. The interaction of these additional atoms with the surface is small at the imaging distance, because symmetric images are obtained. The force distance characteristics resemble those of a negative tip apex ion which could be explained, e.g., by a neutral Si tip.},
doi = {10.1103/PHYSREVB.80.115426},
url = {https://www.osti.gov/biblio/21287071}, journal = {Physical Review. B, Condensed Matter and Materials Physics},
issn = {1098-0121},
number = 11,
volume = 80,
place = {United States},
year = {Tue Sep 15 00:00:00 EDT 2009},
month = {Tue Sep 15 00:00:00 EDT 2009}
}