Effects of focused ion beam induced damage on the plasticity of micropillars
- Air Force Research Laboratory, Materials and Manufacturing Directorate, AFRL/RXLM Wright-Patterson AFB, Ohio 45433-7817 (United States)
- Mechanical and Aerospace Department, University of California, Los Angeles, California 90095-1597 (United States)
The hardening effects of focused ion beam (FIB) induced damage produced during the fabrication of micropillars are examined by introducing a surface layer of nanosized obstacles into a dislocation dynamics simulation. The influence of the depth and strength of the obstacles as a function of pillar diameter is assessed parametrically. We show that for a selected set of sample sizes between 0.5 and 1.0 {mu}m, the flow strength can increase by 10-20 %, for an obstacle strength of 750 MPa, and damage depth of 100 nm. On the other hand, for sizes larger and smaller than this range, the effect of damage is negligible. Results show that the obstacles formed during the FIB milling may be expected to alter the microstructure of micropillars, however, they have a negligible effect on the observed size-strength scaling laws.
- OSTI ID:
- 21287064
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 80, Issue 10; Other Information: DOI: 10.1103/PhysRevB.80.104104; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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