Characterizing structural and vibrational properties of nanoparticles embedded in silica with XAS, SAXS and auxiliary techniques

Journal Article · Thu Jan 29 00:00:00 EST 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3086205· OSTI ID:21260222

Araujo, Leandro L; Kluth, Patrick; Giulian, Raquel; Sprouster, David J; Ridgway, Mark C ^[1]; Johannessen, Bernt; Foran, Garry J ^[2]; Cookson, David J ^[3]

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1. Department of Electronic Materials Engineering, Research School of Physical Sciences and Engineering, Australian National University, Canberra, ACT 0200 (Australia)
2. Australian Nuclear Science and Technology Organisation, Menai, NSW 2234 (Australia)
3. Australian Synchrotron Research Program, Bldg 434, 9700 South Cass Avenue, Argonne IL 60439 (United States)

Synchrotron-based techniques were combined with conventional analysis methods to probe in detail the structural and vibrational properties of nanoparticles grown in a silica matrix by ion implantation and thermal annealing, as well as the evolution of such properties as a function of nanoparticle size. This original approach was successfully applied for several elemental nanoparticles (Au, Co, Cu, Ge, Pt) and the outcomes for Ge are reported here, illustrating the power of this combined methodology. The thorough analysis of XANES, EXAFS, SAXS, TEM and Raman data for Ge nanoparticles with mean diameters between 4 and 9 nm revealed that the peculiar properties of embedded Ge nanoparticles, like the existence of amorphous Ge layers between the silica matrix and the crystalline nanoparticle core, are strongly dependent on particle size and mainly governed by the variation in the surface area-to-volume ratio. Such detailed information provides valuable input for the efficient planning of technological applications.

• OSTI ID: 21260222
• Journal Information: AIP Conference Proceedings, Vol. 1092, Issue 1; Conference: 6. international conference on synchrotron radiation in materials science, Campinas (Brazil), 20-23 Jul 2008; Other Information: DOI: 10.1063/1.3086205; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
ANNEALING
COBALT
COPPER
FINE STRUCTURE
GERMANIUM
GOLD
ION IMPLANTATION
LAYERS
NANOSTRUCTURES
PARTICLE SIZE
PARTICLES
PLATINUM
SILICA
SMALL ANGLE SCATTERING
SURFACE AREA
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY