skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: IBA on functional polymers

Abstract

The analysis of element distributions in polymer-based structures using IBA techniques offers the possibility to study a variety of interesting problems, in particular diffusion and reaction phenomena. Indium diffusion in model polymer light emitting diodes (p-LEDs) consisting of a stack Al/poly-(phenylenevinylene)/indium-tin-oxide/glass has been studied with Rutherford backscattering spectrometry (RBS), particle induced X-ray emission (PIXE), X-ray photoelectron spectroscopy (XPS), and low energy ion scattering (LEIS). A second example is provided by the analysis of organic optical gratings, in which the diffusion of labeled monomers during holographic photo-polymerization of photo-reactive monomer mixtures has been studied with {mu}PIXE using a scanning proton microprobe. Since polymers are sensitive to ion irradiation, a new RBS/ERDA set-up has been constructed that is equipped with a sample holder mounted on a closed cycle helium refrigerator, which enables the cooling of samples to cryogenic temperatures to suppress damage under ion bombardment.

Authors:
; ; ; ;  [1]
  1. Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven (Netherlands)
Publication Date:
OSTI Identifier:
21207981
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 475; Journal Issue: 1; Conference: 15. international conference on the application of accelerators in research and industry, Denton, TX (United States), 4-7 Nov 1998; Other Information: DOI: 10.1063/1.59258; (c) 1999 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; DIFFUSION; HOLOGRAPHY; INDIUM; ION BEAMS; ION MICROPROBE ANALYSIS; LIGHT EMITTING DIODES; MIXTURES; MULTI-ELEMENT ANALYSIS; ORGANIC POLYMERS; PIXE ANALYSIS; POLYMERIZATION; QUANTITATIVE CHEMICAL ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; TIN OXIDES; X-RAY PHOTOELECTRON SPECTROSCOPY

Citation Formats

Jong, M P. de, Simons, D P. L., Ijzendoorn, L J. van, Voigt, M. J. A. de, Reijme, M A, Denier van der Gon, A. W., and Brongersma, H H. IBA on functional polymers. United States: N. p., 1999. Web. doi:10.1063/1.59258.
Jong, M P. de, Simons, D P. L., Ijzendoorn, L J. van, Voigt, M. J. A. de, Reijme, M A, Denier van der Gon, A. W., & Brongersma, H H. IBA on functional polymers. United States. https://doi.org/10.1063/1.59258
Jong, M P. de, Simons, D P. L., Ijzendoorn, L J. van, Voigt, M. J. A. de, Reijme, M A, Denier van der Gon, A. W., and Brongersma, H H. 1999. "IBA on functional polymers". United States. https://doi.org/10.1063/1.59258.
@article{osti_21207981,
title = {IBA on functional polymers},
author = {Jong, M P. de and Simons, D P. L. and Ijzendoorn, L J. van and Voigt, M. J. A. de and Reijme, M A and Denier van der Gon, A. W. and Brongersma, H H},
abstractNote = {The analysis of element distributions in polymer-based structures using IBA techniques offers the possibility to study a variety of interesting problems, in particular diffusion and reaction phenomena. Indium diffusion in model polymer light emitting diodes (p-LEDs) consisting of a stack Al/poly-(phenylenevinylene)/indium-tin-oxide/glass has been studied with Rutherford backscattering spectrometry (RBS), particle induced X-ray emission (PIXE), X-ray photoelectron spectroscopy (XPS), and low energy ion scattering (LEIS). A second example is provided by the analysis of organic optical gratings, in which the diffusion of labeled monomers during holographic photo-polymerization of photo-reactive monomer mixtures has been studied with {mu}PIXE using a scanning proton microprobe. Since polymers are sensitive to ion irradiation, a new RBS/ERDA set-up has been constructed that is equipped with a sample holder mounted on a closed cycle helium refrigerator, which enables the cooling of samples to cryogenic temperatures to suppress damage under ion bombardment.},
doi = {10.1063/1.59258},
url = {https://www.osti.gov/biblio/21207981}, journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 475,
place = {United States},
year = {Thu Jun 10 00:00:00 EDT 1999},
month = {Thu Jun 10 00:00:00 EDT 1999}
}