Optimal design of antireflection coating and experimental verification by plasma enhanced chemical vapor deposition in small displays
- Department of Aeronautics and Astronautics, National Cheng Kung University, Taiwan 701 (China)
Conventional antireflection coating by thin films of quarter-wavelength thickness is limited by material selections and these films' refractive indices. The optimal design by non-quarter-wavelength thickness is presented in this study. A multilayer thin-film model is developed by the admittance loci to show that the two-layer thin film of SiN{sub x}/SiO{sub y} at 124/87 nm and three layer of SiN{sub x}/SiN{sub y}/SiO{sub z} at 58/84/83 nm can achieve average transmittances of 94.4% and 94.9%, respectively, on polymer, glass, and silicon substrates. The optimal design is validated by plasma enhanced chemical vapor deposition of N{sub 2}O/SiH{sub 4} and NH{sub 3}/SiH{sub 4} to achieve the desired optical constants. Application of the antireflection coating to a 4 in. liquid crystal display demonstrates that the transmittance is over 94%, the mean luminance can be increased by 25%, and the total reflection angle increased from 41 deg. to 58 deg.
- OSTI ID:
- 21195007
- Journal Information:
- Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films, Vol. 27, Issue 2; Other Information: DOI: 10.1116/1.3081962; (c) 2009 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1553-1813
- Country of Publication:
- United States
- Language:
- English
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