Study of gadolinia-doped ceria solid electrolyte surface by XPS

Journal Article · Sun Feb 15 00:00:00 EST 2009 · Materials Characterization

DOI:https://doi.org/10.1016/j.matchar.2008.08.002· OSTI ID:21192598

Datta, Pradyot ^[1]; Majewski, Peter ^[2]; Aldinger, Fritz ^[3]

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1. Technische Universitaet Clausthal, Institut fuer Metallurgie, 42 Robert-Koch Strasse, 38678, Clausthal-Zellerfeld (Germany)
2. University of South Australia, School of Advanced Manufacturing and Mechanical Engineering, Mawson Institute, Mawson Lakes, SA 5095 (Australia)
3. Max-Planck-Institut fuer Metallforschung and Institut fuer Nichtmetallische and Anorganische Materialien, Universitaet Stuttgart, Pulvermetallurgisches Laboratorium, Heisenbergstrasse 3, Stuttgart 70569 (Germany)

Gadolinia-doped ceria (CGO) is an important material to be used as electrolyte for solid oxide fuel cell for intermediate temperature operation. Ceria doped with 10 mol% gadolinia (Ce{sub 0.9}Gd{sub 0.1}O{sub 1.95}) was prepared by conventional solid state synthesis and found to be single phase by room temperature X-ray diffraction (XRD). The chemical states of the surface of the prepared sample were analyzed by X-ray photoelectron spectroscopy (XPS). Though Gd was present in its characteristic chemical state, Ce was found in both Ce{sup 4+} and Ce{sup 3+} states. Presence of Ce{sup 3+} state was ascribed to the differential yield of oxygen atoms in the sputtering process.

• OSTI ID: 21192598
• Journal Information: Materials Characterization, Vol. 60, Issue 2; Other Information: DOI: 10.1016/j.matchar.2008.08.002; PII: S1044-5803(08)00230-1; Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CERAMICS
CERIUM IONS
CERIUM OXIDES
CHEMICAL STATE
DOPED MATERIALS
GADOLINIUM COMPOUNDS
SOLID ELECTROLYTES
SOLID OXIDE FUEL CELLS
SPUTTERING
SURFACES
SYNTHESIS
TEMPERATURE RANGE 0273-0400 K
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY