Local structures surrounding Zr in nanostructurally stabilized cubic zirconia: Structural origin of phase stability
- Department of Physics, National Tsing Hua University, Hsinchu 30013, Taiwan (China)
- Department of Chemistry, University of Nebraska-Lincoln, Lincoln, Nebraska 68588 (United States)
- Department of Physics, University of Nebraska at Omaha, Omaha, Nebraska 68182 (United States)
- Department of Orthopaedics Surgery and Rehabilitation, University of Nebraska Medical Center, Omaha, Nebraska 68198 (United States)
- National Synchrotron Radiation Research Center, Hsinchu 30013, Taiwan (China)
- Department of Chemistry, National Central University, Jhongli 32001, Taiwan (China)
Local environment surrounding Zr atoms in the thin films of nanocrystalline zirconia (ZrO{sub 2}) has been investigated by using the extended x-ray absorption fine structure (EXAFS) technique. These films prepared by the ion beam assisted deposition exhibit long-range structural order of cubic phase and high hardness at room temperature without chemical stabilizers. The local structure around Zr probed by EXAFS indicates a cubic Zr sublattice with O atoms located on the nearest tetragonal sites with respect to the Zr central atoms, as well as highly disordered locations. Similar Zr local structure was also found in a ZrO{sub 2} nanocrystal sample prepared by a sol-gel method. Variations in local structures due to thermal annealing were observed and analyzed. Most importantly, our x-ray results provide direct experimental evidence for the existence of oxygen vacancies arising from local disorder and distortion of the oxygen sublattice in nanocrystalline ZrO{sub 2}. These oxygen vacancies are regarded as the essential stabilizing factor for the nanostructurally stabilized cubic zirconia.
- OSTI ID:
- 21180000
- Journal Information:
- Journal of Applied Physics, Vol. 104, Issue 11; Other Information: DOI: 10.1063/1.3041490; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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