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Title: Synthesis, X-ray diffraction study and physico-chemical characterizations of KLaP{sub 4}O{sub 12}

Crystals of KLaP{sub 4}O{sub 12} have been synthesized by flux technique and characterized by single-crystal X-ray diffraction. This material crystallizes in the orthorhombic Cmc2{sub 1} space group with lattice parameters: a = 8.547(3) A, b = 11.668(1) A, c = 13.351(2) A, V = 1331.4(5) A{sup 3} and Z = 4. The crystal structure has been refined yielding a final R(F) = 0.015 and wR(F{sup 2})=0.039 for 1303 independent reflections. The three-dimensional framework with intersecting tunnels of KLaP{sub 4}O{sub 12} can be regarded as a succession of alternated [P{sub 4}O{sub 12}]{sup 4-} anionic and K{sup +}, La{sup 3+} cationic layers parallel to the (a and b) plane which are centered by the planes z = 0, 1/2 and 1/4, 3/4, respectively. The title compound has been also characterized by different physico-chemical techniques: IR, NMR and CI spectroscopies and DTA-TGA-DSC thermal analysis.
Authors:
 [1] ;  [2]
  1. Chemistry Department, Sciences Faculty of Bizerta, 7021 Jarzouna, Bizerta (Tunisia), E-mail: WahidBelam@yahoo.fr
  2. Chemistry Department, Sciences Faculty of Bizerta, 7021 Jarzouna, Bizerta (Tunisia)
Publication Date:
OSTI Identifier:
21144092
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 43; Journal Issue: 8-9; Other Information: DOI: 10.1016/j.materresbull.2007.08.021; PII: S0025-5408(07)00367-4; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CALORIMETRY; DIFFERENTIAL THERMAL ANALYSIS; ELECTRICAL PROPERTIES; LANTHANUM COMPOUNDS; LANTHANUM IONS; LATTICE PARAMETERS; LAYERS; MONOCRYSTALS; NUCLEAR MAGNETIC RESONANCE; ORTHORHOMBIC LATTICES; PHOSPHATES; POTASSIUM COMPOUNDS; POTASSIUM IONS; SPACE GROUPS; SPECTROSCOPY; SYNTHESIS; THERMAL GRAVIMETRIC ANALYSIS; X-RAY DIFFRACTION