Development of C{sub 60} plasma ion source for time-of-flight secondary ion mass spectrometry applications

Journal Article · Fri Feb 15 00:00:00 EST 2008 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2804912· OSTI ID:21103969

Qing, Ji; Ye, Chen; Lili, Ji; Hahto, Sami; Leung, Ka-Ngo; Lee, Tae Geol; Moon, Dae Won ^[1]

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1. Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)

Initial data from a multicusp ion source developed for buckminsterfullerene (C{sub 60}) cluster ion production are reported in this article. A C{sub 60}{sup +} beam current of 425 nA and a C{sub 60}{sup -} beam current of 200 nA are obtainable in continuous mode. Compared to prior work using electron impact ionization, the multicusp ion source provides at least two orders of magnitude increase in the extractable C{sub 60}{sup +} beam current. Mass spectra for both positive and negative bismuth cluster ions generated by the multicusp ion source are also included.

• OSTI ID: 21103969
• Journal Information: Review of Scientific Instruments, Vol. 79, Issue 2; Conference: ICIS 2007: 12. international conference on ion sources, Jeju (Korea, Republic of), 26-31 Aug 2007; Other Information: DOI: 10.1063/1.2804912; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
BEAM CURRENTS
BISMUTH
ELECTRONS
FULLERENES
ION PAIRS
ION SOURCES
IONIZATION
IONS
MASS SPECTRA
MASS SPECTROSCOPY
PLASMA
TIME-OF-FLIGHT METHOD