Analytical Applications Of Particle-Induced X-Ray Emission (PIXE)

Journal Article · Mon Apr 23 00:00:00 EDT 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2733279· OSTI ID:21057196

Popescu, I V; Stihi, C; Bancuta, A; Dima, G ^[1]; Ene, A ^[2]; Badica, T ^[3]; Ghisa, V ^[4]

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1. 'Valahia' University of Targoviste, Targoviste (Romania)
2. 'Dunarea de Jos' University of Galati, Galati (Romania)
3. 'Horia Hulubei' NIPNE, Bucharest (Romania)
4. 'Ovidius' University of Constanta, Constanta (Romania)

In this paper a complex study of the capabilities of Particle-Induced X-ray Emission (PIXE) technique for the determination of major, minor and trace constituents of metallurgical, biological and environmental samples has been done. The elements identified in the metallurgical samples (steels) using PIXE were: K, Ca, V, Cr, Mn, Fe, Co, Cu, Ni, Zn, W, Ga, As, Pb, Mo, Rb, In, Rh, Zr, Pd, Nb, Sn and Sb. In the investigated biological and environmental samples (vegetals leaves, soil and mosses) PIXE analysis allowed determination of: S, Cl, K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, As, Hg and Pb.

• OSTI ID: 21057196
• Journal Information: AIP Conference Proceedings, Vol. 899, Issue 1; Conference: 6. international conference of the Balkan Physical Union, Istanbul (Turkey), 22-26 Aug 2006; Other Information: DOI: 10.1063/1.2733279; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ALKALI METALS
BIOLOGICAL MATERIALS
ENVIRONMENTAL MATERIALS
ION MICROPROBE ANALYSIS
MULTI-ELEMENT ANALYSIS
PHOTON EMISSION
PIXE ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
SOILS
STEELS
TRACE AMOUNTS
TRANSITION ELEMENTS
X RADIATION