Characteristics of the MBE1 End-Station at PNC/XOR
- Department of Physics, Simon Fraser University, 8888 University Drive, Burnaby, BC, V5A 1S6 (Canada)
- Dept. of Physics, U. of Guelph, Guelph, Ontario, N1G 2W1 (Canada)
- Science Technical Centre, Simon Fraser University (Canada)
- Australian Synchrotron. 800 Blackburn Rd, Clayton VIC 3168 (Australia)
An end-station for in-situ characterization of thin films at the PNC/XOR undulator beamline, Sector 20 of the Advanced Photon Source, is detailed. The ability to study films in-situ on a beamline enables examination of surfaces and interfaces on freshly-prepared films, without the influence of a capping layer. The MBE1 molecular beam epitaxy system was designed with this in mind. Now in routine operation and available for General Users on a collaborative basis, the primary function of MBE1 is to undertake polarization-dependent XAFS studies on fresh or stored films, but it also has the capability to do X-ray Standing Wave and Reflectivity measurements. The characteristics of the MBE1 system - its ranges of motions and detector options - are described in detail, with example data illustrating its functionality.
- OSTI ID:
- 21054769
- Journal Information:
- AIP Conference Proceedings, Vol. 882, Issue 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644693; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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