Fluorescence XAFS Study on Local Structure around Cr Atoms Doped in ZnTe

Journal Article · Fri Feb 02 00:00:00 EST 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2644578· OSTI ID:21054670

Ofuchi, Hironori ^[1]; Ozaki, Nobuhiko; Kinjyo, Hidekazu; Kuroda, Shinji; Takita, Koki ^[2]; Nishizawa, Nozomi

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1. Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5198 (Japan)
2. Institute of Materials Science, University of Tsukuba, 1-1-1 Tennoudai, Tsukuba, Ibaraki 305-8573 (Japan)

The geometric structures for ferromagnetic Zn1-xCrxTe films grown by molecular beam epitaxy were investigated by fluorescence XAFS measurements in order to elucidate the relationship between the geometric structure and the magnetic properties. XAFS analysis suggested that the majority of Cr atoms doped in CrTe substituted the Zn-site in the ZnTe lattice below the Cr content x = 0.048, and formed Cr-Te compounds such as Cr2Te3 and CrTe above x = 0.090. It is suggested that ferromagnetism of the Zn1-xCrxTe films above x = 0.090 is due to the formation of Cr-Te compounds.

• OSTI ID: 21054670
• Journal Information: AIP Conference Proceedings, Vol. 882, Issue 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644578; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
ATOMS
CHROMIUM COMPOUNDS
CRYSTAL STRUCTURE
DOPED MATERIALS
FERROMAGNETISM
FILMS
FINE STRUCTURE
FLUORESCENCE
LAYERS
MAGNETIC PROPERTIES
MOLECULAR BEAM EPITAXY
SEMICONDUCTOR MATERIALS
X-RAY SPECTROSCOPY
ZINC TELLURIDES