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Title: The Hybrid Pixel Single Photon Counting Detector XPAD

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2436252· OSTI ID:21049209
; ;  [1]; ; ;  [2]; ; ; ; ; ; ; ; ; ; ;  [3]
  1. Synchrotron SOLEIL, L'Orme des Merisiers, Saint Aubin BP 48, 91192 Gif sur Yvette CEDEX (France)
  2. D2AM-CRG/ESRF, 38042 Grenoble and Laboratoire de Cristallographie, CNRS, 38042 Grenoble (France)
  3. CPPM-IN2P3, Luminy, 13288 Marseille (France)

The XPAD detector is a 2D X-ray imager based on hybrid pixel technology, gathering 38400 pixels on a surface of 68*68 mm2. It is a photon counting detector, with low noise, wide dynamic range and high speed read out, which make it particularly suitable for third generation synchrotron applications, such as diffraction, small angle X-ray scattering or macro-molecular crystallography, but also for small animal imaging. High resolution powder diffraction data and in situ scattering data of crystallization of liquid oxides are presented to illustrate the properties of this detector, resulting in a significant gain in data acquisition time and a capability to follow fast kinetics in real time experiments. The characteristics of the future generation of XPAD detector, which will be available in 2007, are also presented.

OSTI ID:
21049209
Journal Information:
AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436252; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English