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Title: Highly Charged Ions from Laser-Cluster Interactions: Local-Field-Enhanced Impact Ionization and Frustrated Electron-Ion Recombination

Our molecular dynamics analysis of Xe{sub 147-5083} clusters identifies two mechanisms that contribute to the yet unexplained observation of extremely highly charged ions in intense laser cluster experiments. First, electron impact ionization is enhanced by the local cluster electric field, increasing the highest charge states by up to 40%; a corresponding theoretical method is developed. Second, electron-ion recombination after the laser pulse is frustrated by acceleration electric fields typically used in ion detectors. This increases the highest charge states by up to 90%, as compared to the usual assumption of total recombination of all cluster-bound electrons. Both effects together augment the highest charge states by up to 120%, in reasonable agreement with experiments.
Authors:
; ;  [1]
  1. Center for Photonics Research, University of Ottawa, Ottawa (Canada)
Publication Date:
OSTI Identifier:
21024536
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review Letters; Journal Volume: 99; Journal Issue: 23; Other Information: DOI: 10.1103/PhysRevLett.99.233401; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ATOMIC CLUSTERS; CHARGE STATES; ELECTRIC FIELDS; ELECTRON-ION COLLISIONS; ELECTRONS; IONIZATION; LASERS; MOLECULAR DYNAMICS METHOD; RECOMBINATION; XENON