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Title: Structural and conductivity studies of CsKSO{sub 4}Te(OH){sub 6} and Rb{sub 1.25}K{sub 0.75}SO{sub 4}Te(OH){sub 6} materials

The crystal structures of the title compounds were solved using the single-crystal X-ray diffraction technique. At room temperature CsKSO{sub 4}Te(OH){sub 6} was found to crystallize in the monoclinic system with Pn space group and lattice parameters: a=12.5463(6)A; b=6.5765(2)A; c=12.6916(7)A; {beta}=106.53(2){sup o}; V=1003.914(4)A{sup 3}; Z=4 and D{sub calc.}=3.29g/cm{sup 3}. The structural refinement has led to a reliability factor of R{sub 1}=0.0284 (wR{sub 2}=0.064) for 7577 independent reflections. Rb{sub 1.25}K{sub 0.75}SO{sub 4}Te(OH){sub 6} material possesses a monoclinic structure with space group P2{sub 1}/a and cell parameters: a=11.3411(6)A; b=6.5819(2)A; c=13.5730(8)A; {beta}=106.860(10){sup o}; V=969.62(10)A{sup 3}; Z=4 and D=3.16(3)g/cm{sup 3}. The residuals are R{sub 1}=0.0297 and wR{sub 2}=0.0776 for 3336 independent reflections. The main interest of these structures is the presence of two different and independent anionic groups (TeO{sub 6}{sup 6-} and SO{sub 4}{sup 2-}) in the same crystal. Complex impedance measurements (Z*=Z{sup '}-iZ{sup '}') have been undertaken in the frequency and temperature ranges 20-10{sup 6}Hz and 400-600K, respectively. The dielectric relaxation is studied in the complex modulus formalism M*.
Authors:
 [1] ;  [2] ;  [3]
  1. Laboratoire de Physique Appliquee, Faculte des Sciences de Sfax, 3018 Sfax (Tunisia). E-mail: nizar_chabchoub@yahoo.fr
  2. Institut de Chimie de la Matiere Condensee de Bordeaux, ICMCB-CNRS, 33608 Pessac cedex (France)
  3. Laboratoire de Physique Appliquee, Faculte des Sciences de Sfax, 3018 Sfax (Tunisia)
Publication Date:
OSTI Identifier:
20905363
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Solid State Chemistry; Journal Volume: 179; Journal Issue: 7; Other Information: DOI: 10.1016/j.jssc.2006.04.020; PII: S0022-4596(06)00231-3; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CESIUM COMPOUNDS; DIELECTRIC MATERIALS; HYDROXIDES; IMPEDANCE; LATTICE PARAMETERS; MONOCLINIC LATTICES; MONOCRYSTALS; POTASSIUM COMPOUNDS; SPACE GROUPS; SULFATES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; X-RAY DIFFRACTION