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Title: Simultaneous measurements of photoemission and morphology of various Al alloys during mechanical deformation

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.2364581· OSTI ID:20884886
; ;  [1]
  1. Department of Physics and Astronomy, Washington State University, Pullman, Washington 99164-2814 (United States)

We report simultaneous measurements of strain and photoelectron emission from high purity Al (1350), Al-Mg (5052), Al-Mn (3003), Al-Cu (2024), and Al-Mg-Si (6061) alloys under uniaxial tension due to pulsed excimer laser radiation (248 nm). The emission of low-energy photoelectrons is sensitive to deformation-induced changes in surface morphology, including the formation of slip lines and slip bands. Alloy composition and surface treatment significantly influence the photoemission during deformation. Surface oxide enhances the signal-to-noise level during photoemission measurement. In the early stage of deformation (strain {<=}0.04), photoemission intensity increases gradually in a nonlinear fashion. While subsequent photoemission increases almost linearly with strain until failure in samples with thin oxide layer ({approx}31 A ring ), there are two linear segments of photoemission for the samples with oxide of 45 A ring . The onset of strain localization corresponds to the intersection point of two linear segments, usually at a strain of 0.08-0.20. A constitutive model incorporating microstructure evolution and work hardening during tensile deformation is proposed to qualitatively interpret the growth of the photoemission as a function of strain. Photoemissions from various alloys are interpreted in the light of surface treatment, work function, composition, and microstructural development during deformation.

OSTI ID:
20884886
Journal Information:
Journal of Applied Physics, Vol. 100, Issue 10; Other Information: DOI: 10.1063/1.2364581; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English