Scanning tunneling microscopy investigations of hydrogen plasma-induced electron scattering centers on single-walled carbon nanotubes
- Empa, Swiss Federal Laboratories for Materials Testing and Research, Feuerwerkerstrasse 39, CH-3602 Thun (Switzerland)
The authors report on the generation of localized defects on single-walled carbon nanotubes by means of a hydrogen electron cyclotron resonance plasma. The defects have been investigated using scanning tunneling microscopy (STM) and show an apparent topographic height in the STM of 1-3 A. In the vicinity of defects, characteristic superstructures could be observed and the patterns could be simulated using a simple model based on large momentum scattering of the valence electrons. The combination of low structural damage and high electronic activity opens the possibility to tune the electronic transport properties using such defects.
- OSTI ID:
- 20883255
- Journal Information:
- Applied Physics Letters, Vol. 90, Issue 1; Other Information: DOI: 10.1063/1.2428594; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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