SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range

Journal Article · Wed Nov 15 00:00:00 EST 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2372731· OSTI ID:20861490

Ghiringhelli, G; Piazzalunga, A; Dallera, C; Trezzi, G; Braicovich, L; Schmitt, T; Strocov, V N; Betemps, R; Patthey, L; Wang, X; Grioni, M ^[1]

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1. Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milan (Italy)

We present a 5 m long spectrometer for soft x rays to be used at a synchrotron radiation beamline for resonant x-ray emission spectroscopy and resonant inelastic x-ray scattering in the 400-1600 eV energy range. It is based on a variable line spacing spherical grating (average groove density of 3200 mm{sup -1}, R=58.55 m) and a charge coupled device two dimensional detector. With an x-ray spot on the sample of 10 {mu}m, the targeted resolving power is higher than 10 000 at all energies below 1100 eV and better than 7000 at 1500 eV. The off-line tests made with Al and Mg K{alpha}{sub 1,2} fluorescence emissions indicate that the spectrometer can actually work at 12 000 and 17 000 resolving power at the L{sub 3} edges of Cu (930 eV) and of Ti (470 eV), respectively. SAXES (superadvanced x-ray emission spectrometer) is mounted on a rotating platform allowing to vary the scattering angle from 25 degree sign to 130 degree sign . The spectrometer will be operational at the ADRESS (advanced resonant spectroscopies) beamline of the Swiss Light Source from 2007.

• OSTI ID: 20861490
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 11; Other Information: DOI: 10.1063/1.2372731; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGE-COUPLED DEVICES
EMISSION SPECTROSCOPY
EV RANGE 100-1000
FLUORESCENCE
KEV RANGE 01-10
RESOLUTION
SMALL ANGLE SCATTERING
SOFT X RADIATION
SPHERICAL CONFIGURATION
SWISS LIGHT SOURCE
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY