Acoustic Pulse Echoes Probed with Time-Resolved X-Ray Triple-Crystal Diffractometry

Journal Article · Fri Mar 24 00:00:00 EST 2006 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.96.1· OSTI ID:20778835

Hayashi, Yujiro ^[1]; Tanaka, Yoshihito ^[2]; CREST, JST ^[3]; Kirimura, Tomoyuki; Ishikawa, Tetsuya ^[2]; Tsukuda, Noboru; Kuramoto, Eiichi ^[4]

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1. Interdisciplinary Graduate School of Engineering Sciences, Kyushu Univ., Kasuga, Fukuoka 816-8580 (Japan)
2. RIKEN SPring-8 Center, Sayo-cho Sayo-gun, Hyogo 679-5148 (Japan)
3. Japan
4. Research Institute for Applied Mechanics, Kyushu Univ., Kasuga, Fukuoka 816-8580 (Japan)

Acoustic pulse echoes generated by femtosecond laser irradiation were detected using time-resolved x-ray triple-crystal diffractometry. The determined time-dependent longitudinal strain component for pulse echoes in silicon and gallium arsenide plates showed that the polarity of the strain pulse was dependent on the optically induced initial stress, and that the bipolar pulse waveform was gradually deformed and broadened in the course of propagation. The three-dimensional wave front distortion of pulse echoes was shown simply as the pulse duration broadening, which was consistent with a boundary roughness for an unpolished plate.

• OSTI ID: 20778835
• Journal Information: Physical Review Letters, Vol. 96, Issue 11; Other Information: DOI: 10.1103/PhysRevLett.96.115505; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CRYSTALS
GALLIUM ARSENIDES
LASER RADIATION
PLATES
PULSES
ROUGHNESS
SILICON
STRAINS
STRESSES
THREE-DIMENSIONAL CALCULATIONS
TIME DEPENDENCE
TIME RESOLUTION
WAVE FORMS
X-RAY DIFFRACTION