Degradation and recovery of polarization under synchrotron x rays in SrBi{sub 2}Ta{sub 2}O{sub 9} ferroelectric capacitors

Journal Article · Tue Feb 15 00:00:00 EST 2005 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1851598· OSTI ID:20668202

Menou, N; Castagnos, A -M; Muller, Ch; Goguenheim, D; Goux, L; Wouters, D J; Hodeau, J -L; Dooryhee, E; Barrett, R ^[1]

---

1. Laboratoire Materiaux et Microelectronique de Provence (L2MP), UMR Centre National de la Recherche Scientifique (CNRS) 6137, Universite du Sud Toulon Var, BP 20132, F-83957 La Garde Cedex (France)

Elementary Pt/SrBi{sub 2}Ta{sub 2}O{sub 9}/Pt ferroelectric capacitors have been structurally characterized by x-ray diffraction using highly brilliant synchrotron radiation. A microstructural analysis of the stacked layers was performed from the collection of high-quality one-dimensional and two-dimensional diffraction patterns. During x-ray diffraction experiments, peculiar electrical behaviors under irradiation were evidenced. Indeed, depending upon their initial state (poled or nonpoled), the capacitors have exhibited drastic changes in their electrical characteristics after or under irradiation, both 'fatiguelike' (polarization reduction) and/or 'imprintlike' (voltage shift) phenomena being observed. Using a sample environment specially designed to measure in situ the evolutions of ferroelectric characteristics, the kinetics of both degradation and restoration of ferroelectric properties of the SrBi{sub 2}Ta{sub 2}O{sub 9}-based capacitors under x-ray radiation have been analyzed. Reduction and recovery of switchable polarization have been explained in terms of interaction between ferroelectric domain configuration and photoinduced charge carriers. Mechanisms of charge trapping proposed in the literature are discussed to explain aging and rejuvenation.

• OSTI ID: 20668202
• Journal Information: Journal of Applied Physics, Vol. 97, Issue 4; Other Information: DOI: 10.1063/1.1851598; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AGING
BISMUTH COMPOUNDS
CAPACITORS
CRYSTAL STRUCTURE
DIELECTRIC MATERIALS
EVOLUTION
HOLES
HYSTERESIS
KINETICS
LAYERS
MICROSTRUCTURE
ONE-DIMENSIONAL CALCULATIONS
PLATINUM
STRONTIUM COMPOUNDS
SYNCHROTRON RADIATION
TANTALATES
THIN FILMS
TRAPPING
TWO-DIMENSIONAL CALCULATIONS
X-RAY DIFFRACTION