An Electron-Beam Profile Monitor Using Fresnel Zone Plates

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757854· OSTI ID:20653004

Nakamura, Norio; Sakai, Hiroshi; Iida, Kensuke; Shinoe, Kenji; Takaki, Hiroyuki; Fujisawa, Masami; Hayano, Hitoshi; Muto, Toshiya; Nomura, Masaharu; Kamiya, Yukihide; Koseki, Tadashi; Amemiya, Yoshiyuki; Aoki, Nobutada; Nakayama, Koichi ^[1]

---

1. Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashianoha, Kashiwa, Chiba 277-8581 (Japan)

We have developed a beam profile monitor using two Fresnel zone plates (FZPs) at the KEK-ATF (Accelerator Test Facility) damping ring to measure small electron-beam sizes for low-emittance synchrotron radiation sources. The monitor has a structure of an X-ray microscope, where two FZPs constitute an X-ray imaging optics. In the monitor system, the synchrotron radiation from the electron beam at the bending magnet is monochromatized to 3.235-keV X-rays by a crystal monochromator and the transverse electron-beam image is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. This monitor has the following advantages: (1) high spatial resolution, (2) non-destructive measurement, (3) real-time monitoring, and (4) direct electron-beam imaging. With the beam profile monitor, we have succeeded in obtaining a clear electron-beam image and measuring the extremely small beam size less than 10 {mu}m. The measured magnification of the imaging optics was in good agreement with the design value.

• OSTI ID: 20653004
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757854; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM MONITORING
BEAM MONITORS
BEAM OPTICS
BEAM PROFILES
BENDING
CAMERAS
CHARGE-COUPLED DEVICES
CRYSTALS
CYCLIC ACCELERATORS
ELECTRON BEAMS
FRESNEL LENS
IMAGES
JAPANESE ORGANIZATIONS
MAGNETS
MICROSCOPES
SPATIAL RESOLUTION
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
TEST FACILITIES
X RADIATION