skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Experiments with rf ovens in ECR ion sources

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1808914· OSTI ID:20644021
; ;  [1]
  1. INFN-LNL, Viale dell'Universita n.2, 35020 Legnaro, PD (Italy)

A 34 mm diameter radio frequency (rf) oven system previously developed on bench was inserted and tested into the Electron Cyclotron Resonance (ECR) Ion Source Alice, producing beams from natural copper and silver samples; charge range was typically i=10-13 for copper and i=10-19 for silver, which well compares to previous source yield for xenon (charges 11-20). Some issues of oven design, including wire section effects, and circuit matching, are discussed; taps on the coupling transformer improved the flexibility of rf matching to different crucible materials (tantalum or steel). Details of operating experience (cleaning the oven and replacing sample) are reported; sample duration was more than 100 h and temperature T{sub s} in excess of 1750 K were demonstrated. The ion source operation depends on both the oven distance L{sub oe} from ECR plasma and the bias voltage V{sub b} of the sample. Best conditions were found for close (L{sub oe} congruent with 70 mm) or preferably intermediate positions (L{sub oe} congruent with 106 mm) and for sample negative respect to ECR chamber V{sub b}<-400 V. Final results of current for silver [for example I({sup 107}Ag{sup 17+}) about 1000 nA] are well comparable to xenon case [for example I({sup 129}Xe{sup 18+}) about 500 nA] after correcting for isotopic abundance. Memory effect of metal ion generation was also important and is discussed as well as other time dependent effects and an empirical fit for the aggregate results of silver mass flow. New oven prototypes reached T{sub s} congruent with 2250 K in development tests.

OSTI ID:
20644021
Journal Information:
Review of Scientific Instruments, Vol. 75, Issue 11; Other Information: DOI: 10.1063/1.1808914; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English