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Title: Absolute calibration of vacuum ultraviolet spectrograph system for plasma diagnostics

A space- and time-resolving vacuum ultraviolet (VUV) spectrograph system has been applied to diagnose impurity ions behavior in plasmas produced in the tandem mirror GAMMA 10 and the reversed field pinch TPE-RX. We have carried out ray tracing calculations for obtaining the characteristics of the VUV spectrograph and calibration experiments to measure the absolute sensitivities of the VUV spectrograph system for the wavelength range from 100 to 1100 A. By changing the incident angle, 50.6 deg. -51.4 deg., to the spectrograph whose nominal incident angle is 51 deg., we can change the observing spectral range of the VUV spectrograph. In this article, we show the ray tracing calculation results and absolute sensitivities when the angle of incidence into the VUV spectrograph is changed, and the results of VUV spectroscopic measurement in both GAMMA 10 and TPE-RX plasmas.
Authors:
; ; ; ; ; ; ; ; ;  [1] ;  [2] ;  [2]
  1. Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577 (Japan)
  2. (Japan)
Publication Date:
OSTI Identifier:
20641238
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 75; Journal Issue: 10; Conference: 15. topical conference on high temperature plasma diagnostics, San Diego, CA (United States), 19-22 Apr 2004; Other Information: DOI: 10.1063/1.1789264; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; CALIBRATION; FAR ULTRAVIOLET RADIATION; GAMMA 10 DEVICES; INCIDENCE ANGLE; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; REVERSE-FIELD PINCH; SENSITIVITY; TPE-RX DEVICE; ULTRAVIOLET SPECTROMETERS; WAVELENGTHS