Soft-x-ray Kossel structures from W/C multilayers under various electron ionization conditions

Journal Article · Mon Sep 01 00:00:00 EDT 2003 · Physical Review. A

DOI:https://doi.org/10.1103/PhysRevA.68.032505· OSTI ID:20640167

Jonnard, P; Andre, J -M; Bonnelle, C; Bridou, F; Pardo, B ^[1]

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1. Laboratoire de Chimie Physique--Matiere et Rayonnement, UMR-CNRS 7614, Universite Pierre et Marie Curie, 11 Rue Pierre et Marie Curie, F-75231 Paris Cedex 05, (France)

The intensity of the W M{alpha} line emitted by tungsten present in W/C multilayer interferential mirrors (MIM) under electron excitation is studied as a function of the detection angle of the photons. The measurements are performed for various incident-electron energies and several numbers of bilayers constituting the MIM. A spatial modulation of the x-ray intensity is observed in a domain of detection angle around the Bragg angle of the W/C multilayer for the W M{alpha} emission. The experimental results are compared to a model based on the reciprocity theorem using nonuniform ionization distributions. We suggest that the intensity modulation is due to the interferences between the forward and backward traveling waves inside the MIM.

• OSTI ID: 20640167
• Journal Information: Physical Review. A, Vol. 68, Issue 3; Other Information: DOI: 10.1103/PhysRevA.68.032505; (c) 2003 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
BRAGG REFLECTION
CARBON
DETECTION
DISTRIBUTION
ELECTRONS
EMISSION
EMISSION SPECTRA
EXCITATION
INTERFERENCE
IONIZATION
MODULATION
PHOTONS
SOFT X RADIATION
TRAVELLING WAVES
TUNGSTEN
X-RAY SPECTRA