Local anisotropic structure in amorphous Ba-Fe-O films and its role in determining magnetic anisotropy in crystallized Ba-hexaferrite films

Journal Article · Wed Nov 01 00:00:00 EST 1995 · IEEE Transactions on Magnetics

DOI:https://doi.org/10.1109/20.489791· OSTI ID:186962

Snyder, J E; Harris, V G; Koon, N C ^[1]; Sui, X ^[2]; Kryder, M H ^[3]

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1. Naval Research Lab., Washington, DC (United States)
2. Seagate Technology, Bloomington, MN (United States)
3. Carnegie Mellon Univ., Pittsburgh, PA (United States). Data Storage Systems Center

Ba hexaferrite films with the easy direction of magnetization perpendicular or in-plane can be prepared by crystallization of amorphous films deposited under different sputtering conditions. Using polarization-dependent EXAFS (extended x-ray absorption fine structure), the authors have observed anisotropic local structure around the Fe atoms in as-sputtered amorphous Ba-Fe-O films. Such structure has not been detectable by conventional structural characterization techniques (x-ray diffraction, electron diffraction and transmission electron microscopy [TEM]). The results suggest that this local structural anisotropy determines the orientation of the fast-growing basal plane directions during post-deposition annealing and thus the directions of the c-axes and the magnetic anisotropy

• OSTI ID: 186962
• Report Number(s): CONF-950404-; ISSN 0018-9464; TRN: IM9609%%235
• Journal Information: IEEE Transactions on Magnetics, Vol. 31, Issue 6Pt2; Conference: Conference on magnetism and magnetic materials, San Antonio, TX (United States), 18-21 Apr 1995; Other Information: PBD: Nov 1995
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
CRYSTAL STRUCTURE
MAGNETIC PROPERTIES
IRON OXIDES
EXPERIMENTAL DATA
CRYSTALLIZATION