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Title: Degradation Analysis of Weathered Crystalline-Silicon PV Modules: Preprint

We present an analysis of the results of a solar weathering program that found a linear relationship between maximum power degradation and the total UV exposure dose for four different types of commercial crystalline Si modules. The average degradation rate for the four modules types was 0.71% per year. The analysis showed that losses of short-circuit current were responsible for the maximum power degradation. Judging by the appearance of the undegraded control modules, it is very doubtful that the short-circuit current losses were caused by encapsulation browning or obscuration. When we compared the quantum efficiency of a single cell in a degraded module to one from an unexposed control module, it appears that most of the degradation has occurred in the 800 - 1100 nm wave-length region, and not the short wavelength region.
Authors:
; ; ;
Publication Date:
OSTI Identifier:
15006975
Report Number(s):
NREL/CP-520-31455
TRN: US200412%%544
DOE Contract Number:
AC36-99-GO10337
Resource Type:
Conference
Resource Relation:
Conference: Conference title not supplied, Conference location not supplied, Conference dates not supplied; Other Information: PBD: 1 May 2002; Related Information: Prepared for the 29th IEEE PV Specialists Conference, 20-24 May
Research Org:
National Renewable Energy Lab., Golden, CO (US)
Sponsoring Org:
US Department of Energy (US)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; ENCAPSULATION; QUANTUM EFFICIENCY; WAVELENGTHS; WEATHERING; SOLAR ENERGY PV; WEATHERED CRYSTALLINE-SILICON; DEGRADATION ANALYSIS; SHORT-CIRCUIT CURRENT; MANUFACTURERS; QUANTUM EFFICIENCY; STANDARD GLOBAL REFERENCE; LIGHT-INDUCED; ENCAPSULATION BROWNING; SOLAR ENERGY - PHOTOVOLTAICS