Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope

Journal Article · Thu May 22 00:00:00 EDT 2014 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927614000956· OSTI ID:1392491

Zaluzec, Nestor J.

Closed form analytical equations used to calculate the collection solid angle of six common geometries of solid-state X-ray detectors in scanning and scanning/transmission analytical electron microscopy are presented. Using these formulae one can make realistic comparisons of the merits of the different detector geometries in modern electron column instruments. This work updates earlier formulations and adds new detector configurations.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1392491
• Journal Information: Microscopy and Microanalysis, Vol. 20, Issue 04; ISSN 1431-9276
• Publisher: Microscopy Society of America (MSA)
• Country of Publication: United States
• Language: English