Advances in high-resolution RIXS for the study of excitation spectra under high pressure
Abstract
Hard x-ray resonant inelastic x-ray scattering (RIXS) is a promising x-ray spectroscopic tool for measuring low-energy excitation spectra at high pressure which have been stymied heretofore by the technical difficulties inherent in measuring a sample held at high pressure in a diamond anvil cell. The currently available facilities of high resolution (< 200 meV) RIXS has been used to probe low-energy excitation spectra from the diamond anvil cell, by virtue of advanced photon detection instrumentations of high-brilliance synchrotron x-ray radiation sources. Compared to a structural elastic scattering and x-ray emission, RIXS is a photon hungry technique and high-resolution RIXS under high pressure is at its infancy stage. In this review, the fundamentals of RIXS including instrumentation of high-resolution RIXS are presented and then experimental details of diamond anvil cell, sample preparation and measurement geometry are discussed. Experimental data of 3d and 5d transition metal oxides are presented. Finally, future improvements in high-resolution RIXS instrumentation for the high pressure experiment is discussed.
- Authors:
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division
- OSTI Identifier:
- 1392045
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Journal Article
- Journal Name:
- High Pressure Research
- Additional Journal Information:
- Journal Volume: 36; Journal Issue: 3; Journal ID: ISSN 0895-7959
- Publisher:
- Taylor & Francis
- Country of Publication:
- United States
- Language:
- English
- Subject:
- Resonant inelastic x-ray scattering; electronic and magnetic excitations; high pressure
Citation Formats
Kim, Jungho. Advances in high-resolution RIXS for the study of excitation spectra under high pressure. United States: N. p., 2016.
Web. doi:10.1080/08957959.2016.1212990.
Kim, Jungho. Advances in high-resolution RIXS for the study of excitation spectra under high pressure. United States. https://doi.org/10.1080/08957959.2016.1212990
Kim, Jungho. 2016.
"Advances in high-resolution RIXS for the study of excitation spectra under high pressure". United States. https://doi.org/10.1080/08957959.2016.1212990.
@article{osti_1392045,
title = {Advances in high-resolution RIXS for the study of excitation spectra under high pressure},
author = {Kim, Jungho},
abstractNote = {Hard x-ray resonant inelastic x-ray scattering (RIXS) is a promising x-ray spectroscopic tool for measuring low-energy excitation spectra at high pressure which have been stymied heretofore by the technical difficulties inherent in measuring a sample held at high pressure in a diamond anvil cell. The currently available facilities of high resolution (< 200 meV) RIXS has been used to probe low-energy excitation spectra from the diamond anvil cell, by virtue of advanced photon detection instrumentations of high-brilliance synchrotron x-ray radiation sources. Compared to a structural elastic scattering and x-ray emission, RIXS is a photon hungry technique and high-resolution RIXS under high pressure is at its infancy stage. In this review, the fundamentals of RIXS including instrumentation of high-resolution RIXS are presented and then experimental details of diamond anvil cell, sample preparation and measurement geometry are discussed. Experimental data of 3d and 5d transition metal oxides are presented. Finally, future improvements in high-resolution RIXS instrumentation for the high pressure experiment is discussed.},
doi = {10.1080/08957959.2016.1212990},
url = {https://www.osti.gov/biblio/1392045},
journal = {High Pressure Research},
issn = {0895-7959},
number = 3,
volume = 36,
place = {United States},
year = {Sat Jul 02 00:00:00 EDT 2016},
month = {Sat Jul 02 00:00:00 EDT 2016}
}
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