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Title: Advances in high-resolution RIXS for the study of excitation spectra under high pressure

Abstract

Hard x-ray resonant inelastic x-ray scattering (RIXS) is a promising x-ray spectroscopic tool for measuring low-energy excitation spectra at high pressure which have been stymied heretofore by the technical difficulties inherent in measuring a sample held at high pressure in a diamond anvil cell. The currently available facilities of high resolution (< 200 meV) RIXS has been used to probe low-energy excitation spectra from the diamond anvil cell, by virtue of advanced photon detection instrumentations of high-brilliance synchrotron x-ray radiation sources. Compared to a structural elastic scattering and x-ray emission, RIXS is a photon hungry technique and high-resolution RIXS under high pressure is at its infancy stage. In this review, the fundamentals of RIXS including instrumentation of high-resolution RIXS are presented and then experimental details of diamond anvil cell, sample preparation and measurement geometry are discussed. Experimental data of 3d and 5d transition metal oxides are presented. Finally, future improvements in high-resolution RIXS instrumentation for the high pressure experiment is discussed.

Authors:
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division
OSTI Identifier:
1392045
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
High Pressure Research
Additional Journal Information:
Journal Volume: 36; Journal Issue: 3; Journal ID: ISSN 0895-7959
Publisher:
Taylor & Francis
Country of Publication:
United States
Language:
English
Subject:
Resonant inelastic x-ray scattering; electronic and magnetic excitations; high pressure

Citation Formats

Kim, Jungho. Advances in high-resolution RIXS for the study of excitation spectra under high pressure. United States: N. p., 2016. Web. doi:10.1080/08957959.2016.1212990.
Kim, Jungho. Advances in high-resolution RIXS for the study of excitation spectra under high pressure. United States. https://doi.org/10.1080/08957959.2016.1212990
Kim, Jungho. 2016. "Advances in high-resolution RIXS for the study of excitation spectra under high pressure". United States. https://doi.org/10.1080/08957959.2016.1212990.
@article{osti_1392045,
title = {Advances in high-resolution RIXS for the study of excitation spectra under high pressure},
author = {Kim, Jungho},
abstractNote = {Hard x-ray resonant inelastic x-ray scattering (RIXS) is a promising x-ray spectroscopic tool for measuring low-energy excitation spectra at high pressure which have been stymied heretofore by the technical difficulties inherent in measuring a sample held at high pressure in a diamond anvil cell. The currently available facilities of high resolution (< 200 meV) RIXS has been used to probe low-energy excitation spectra from the diamond anvil cell, by virtue of advanced photon detection instrumentations of high-brilliance synchrotron x-ray radiation sources. Compared to a structural elastic scattering and x-ray emission, RIXS is a photon hungry technique and high-resolution RIXS under high pressure is at its infancy stage. In this review, the fundamentals of RIXS including instrumentation of high-resolution RIXS are presented and then experimental details of diamond anvil cell, sample preparation and measurement geometry are discussed. Experimental data of 3d and 5d transition metal oxides are presented. Finally, future improvements in high-resolution RIXS instrumentation for the high pressure experiment is discussed.},
doi = {10.1080/08957959.2016.1212990},
url = {https://www.osti.gov/biblio/1392045}, journal = {High Pressure Research},
issn = {0895-7959},
number = 3,
volume = 36,
place = {United States},
year = {Sat Jul 02 00:00:00 EDT 2016},
month = {Sat Jul 02 00:00:00 EDT 2016}
}

Works referenced in this record:

Phase-Sensitive Observation of a Spin-Orbital Mott State in Sr2IrO4
journal, March 2009


Novel J eff = 1 / 2 Mott State Induced by Relativistic Spin-Orbit Coupling in Sr 2 IrO 4
journal, August 2008


Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections
journal, November 2012


Inelastic x-ray scattering by electronic excitations under high pressure
journal, March 2010


Cu K -edge resonant inelastic x-ray scattering in edge-sharing cuprates
journal, March 2008


MERIX—Next generation medium energy resolution inelastic X-ray scattering instrument at the APS
journal, June 2013


Pressure-Induced Confined Metal from the Mott Insulator Sr 3 Ir 2 O 7
journal, May 2016


Observation of the spin-Peierls transition in linear Cu 2 + (spin-1/2) chains in an inorganic compound CuGeO 3
journal, June 1993


Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II
journal, September 2011


Resonant inelastic x-ray scattering studies of elementary excitations
journal, June 2011


Front Matter: Volume 8502
conference, October 2012


X-ray resonant Raman scattering in NiO: Resonant enhancement of the charge-transfer excitations
journal, December 1996


Pressure-induced spin transition and evolution of the electronic excitations of FeBO 3 : Resonant inelastic x-ray scattering results
journal, October 2014


Collimating Montel mirror as part of a multi-crystal analyzer system for resonant inelastic X-ray scattering
journal, June 2016