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This content will become publicly available on November 10, 2017

Title: Towards 10 meV resolution: The design of an ultrahigh resolution soft X-ray RIXS spectrometer

Here we present the optical design of the Centurion soft X-ray resonant inelastic X-ray scattering (RIXS) spectrometer to be located on the SIX beamline at NSLS-II. The spectrometer is designed to reach a resolving power of 100 000 at 1000 eV at its best resolution. It is also designed to have continuously variable 2θ motion over a range of 112° using a custom triple rotating flange. We have analyzed several possible spectrometer designs capable of reaching the target resolution. After careful analysis, we have adopted a Hettrick-Underwood spectrometer design, with an additional plane mirror to maintain a fixed direction for the outgoing beam. The spectrometer can cancel defocus and coma aberrations at all energies, has an erect focal plane, and minimizes mechanical motions of the detector. When the beamline resolution is accounted for, the net spectral resolution will be 14 meV at 1000 eV. Lastly, this will open up many low energy excitations to study and will expand greatly the power of soft X-ray RIXS.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Publication Date:
OSTI Identifier:
1340411
Report Number(s):
BNL--113224-2016-JA
Journal ID: ISSN 0034-6748; RSINAK
Grant/Contract Number:
SC0012704; AC02-98CH10886
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 11; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY