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Title: Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

Journal Article · · Chemical Geology
 [1];  [2];  [3]; ORCiD logo [2];  [4];  [5];  [6]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  2. Univ. of Chicago, Argonne, IL (United States); Univ. of Chicago, Chicago, IL (United States)
  3. Univ. of Chicago, Chicago, IL (United States)
  4. Loyola Univ., Chicago, IL (United States)
  5. Univ. of Illinois, Chicago, IL (United States)
  6. California Inst. of Technology (CalTech), Pasadena, CA (United States)

In this paper, X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS) Genesis collector (60326). An internal reference standardization method was developed based on fluorescence from Si and Al in the collector materials. Measured Fe fluence agreed well with that measured previously by us on a sapphire collector (50722) as well as SIMS results by Jurewicz et al. Measured Ni fluence was higher than expected by a factor of two; neither instrumental errors nor solar wind fractionation effects are considered significant perturbations to this value. Impurity Ni within the epitaxial Si layer, if present, could explain the high Ni fluences and therefore needs further investigation. As they stand, these results are consistent with minor temporally-variable Fe and Ni fractionation on the timescale of a year.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES); National Aeronautics and Space Administration (NASA)
Grant/Contract Number:
AC02-06CH11357; FG02-94ER14466
OSTI ID:
1340292
Alternate ID(s):
OSTI ID: 1398680
Journal Information:
Chemical Geology, Vol. 441, Issue C; ISSN 0009-2541
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

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Cited By (1)

The future of Genesis science journal February 2019