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Title: Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films

Bragg projection ptychography (BPP) is a coherent diffraction imaging technique capable of mapping the spatial distribution of the Bragg structure factor in nanostructured thin films. Here, we show that, because these images are projections, the structural sensitivity of the resulting images depends on the film thickness and the aspect ratio and orientation of the features of interest and that image interpretation depends on these factors. Lastly, we model changes in contrast in the BPP reconstructions of simulated PbTiO 3 ferroelectric thin films with meandering 180° stripe domains as a function of film thickness, discuss their origin, and comment on the implication of these factors on the design of BPP experiments of general nanostructured films.
 [1] ;  [2] ;  [1] ;  [1] ;  [3] ;  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. Univ. of Wisconsin, Madison, WI (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Univ. of Wisconsin, Madison, WI (United States)
Publication Date:
OSTI Identifier:
Grant/Contract Number:
AC02-06CH11357; FG02-04ER46147
Accepted Manuscript
Journal Name:
Physical Review A
Additional Journal Information:
Journal Volume: 94; Journal Issue: 4; Journal ID: ISSN 2469-9926
American Physical Society (APS)
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States