Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution
|
journal
|
February 2015 |
Lattice-resolution contrast from a focused coherent electron probe. Part I
|
journal
|
July 2003 |
Exit wave reconstruction at atomic resolution
|
journal
|
July 2004 |
Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy
|
journal
|
January 2012 |
Inelastic scattering of fast electrons by crystals
|
journal
|
August 1995 |
Effects of thermal diffuse scattering and surface tilt on diffraction and channeling of fast electrons in CdTe
|
journal
|
April 1989 |
Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy
|
journal
|
July 2009 |
Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis
|
journal
|
April 2003 |
Requirements contributing to the design of devices used in correcting electron lenses
|
journal
|
August 1954 |
Three-Dimensional Atomic Imaging of Colloidal Core–Shell Nanocrystals
|
journal
|
August 2011 |
Seeing and measuring in 3D with electrons
|
journal
|
February 2014 |
Atomic resolution electron tomography
|
journal
|
July 2016 |
Quantification of the Information Limit of Transmission Electron Microscopes
|
journal
|
November 2008 |
Electron microscopic observation of periodic structures below 10 Å
|
journal
|
December 1957 |
Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity
|
journal
|
December 1993 |
Sub-ångstrom resolution using aberration corrected electron optics
|
journal
|
August 2002 |
Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope
- Behan, G.; Cosgriff, E. C.; Kirkland, Angus I.
-
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 367, Issue 1903
https://doi.org/10.1098/rsta.2009.0074
|
journal
|
September 2009 |
The method of power series tracking for the mathematical description of beam dynamics
|
journal
|
August 1987 |
Arbitrary order description of arbitrary particle optical systems
|
journal
|
December 1990 |
Theorie der Beugung von Elektronen an Kristallen
|
journal
|
January 1928 |
Theory of zone axis electron diffraction
|
journal
|
October 1989 |
Insulating Ferromagnetic Films: A Phase Induced by Ordering of Oxygen Vacancies
|
journal
|
February 2014 |
Imaging at the picoscale
|
journal
|
December 2004 |
Depth sectioning of aligned crystals with the aberration-corrected scanning transmission electron microscope
|
journal
|
March 2006 |
Mapping Octahedral Tilts and Polarization Across a Domain Wall in BiFeO 3 from Z-Contrast Scanning Transmission Electron Microscopy Image Atomic Column Shape Analysis
|
journal
|
October 2010 |
Suppression of Octahedral Tilts and Associated Changes in Electronic Properties at Epitaxial Oxide Heterostructure Interfaces
|
journal
|
August 2010 |
Depth sectioning with the aberration-corrected scanning transmission electron microscope
|
journal
|
February 2006 |
Principles of Optics
|
book
|
January 1999 |
Two-Dimensional Mapping of Chemical Information at Atomic Resolution
|
journal
|
August 2007 |
Atomic-resolution chemical analysis using a scanning transmission electron microscope
|
journal
|
November 1993 |
Strain-Driven Oxygen Deficiency in Self-Assembled, Nanostructured, Composite Oxide Films
|
journal
|
May 2011 |
Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging
|
journal
|
April 2011 |
Watching domains grow: In-situ studies of polarization switching by combined scanning probe and scanning transmission electron microscopy
|
journal
|
September 2011 |
Rotating Anisotropic Crystalline Silicon Nanoclusters in Graphene
|
journal
|
July 2015 |
Strain-Induced Spin States in Atomically Ordered Cobaltites
|
journal
|
January 2012 |
Inelastic scattering of high-energy electrons in real space
|
journal
|
October 1990 |
The spatial resolution of imaging using core-loss spectroscopy in the scanning transmission electron microscope
|
journal
|
March 2005 |
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:
|
journal
|
November 2008 |
The Theory of Atomic Structure and Spectra
|
book
|
December 1981 |
Image Contrast in a Transmission Scanning Electron Microscope
|
journal
|
July 1969 |
Adjustment of a STEM instrument by use of shadow images
|
journal
|
January 1979 |
Fresnel diffraction in a coherent convergent electron beam
|
journal
|
January 1980 |
The scattering of electrons by atoms and crystals. I. A new theoretical approach
|
journal
|
October 1957 |
The present and future of high-resolution electron microscopy
|
journal
|
November 1987 |
Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitations
|
journal
|
November 1978 |
Scanning Electron Microscopes: Is High Resolution Possible?
|
journal
|
November 1966 |
Scanning transmission electron microscopy*
|
journal
|
April 1974 |
Optimization of small electron probes
|
journal
|
January 1987 |
Limits of electron probe formation
|
journal
|
May 1995 |
The Work of Albert Victor Crewe on the Scanning Transmission Electron Microscope and Related Topics
|
book
|
January 2009 |
Visibility of Single Atoms
|
journal
|
June 1970 |
A High‐Resolution Scanning Transmission Electron Microscope
|
journal
|
December 1968 |
Preservation of electron microscope image contrast after inelastic scattering
|
journal
|
July 1969 |
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering
|
journal
|
November 2008 |
Volcano structure in atomic resolution core-loss images
|
journal
|
June 2008 |
Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations
|
journal
|
November 2013 |
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
|
journal
|
April 2015 |
Progress in aberration-corrected scanning transmission electron microscopy
|
journal
|
May 2001 |
Dedicated STEM for 200 to 40 keV operation
|
journal
|
June 2011 |
Estimation of unknown structure parameters from high-resolution (S)TEM images: What are the limits?
|
journal
|
November 2013 |
Resolution: a survey
|
journal
|
January 1997 |
Multislice theory of fast electron scattering incorporating atomic inner-shell ionization
|
journal
|
September 2005 |
Localization of high-energy electron scattering from atomic vibrations
|
journal
|
February 2014 |
Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters
|
journal
|
May 2012 |
Multiple elastic scattering of core-loss electrons in atomic resolution imaging
|
journal
|
May 2008 |
Electron Energy-Loss Spectroscopy in the Electron Microscope
|
book
|
January 2011 |
A comparison of calculated images generated by six modes of transmission electron microscopy
|
journal
|
June 1974 |
Atomic-Resolution Imaging with a Sub-50-pm Electron Probe
|
journal
|
March 2009 |
A reflection on partial coherence in electron microscopy
|
journal
|
January 1976 |
There's plenty of room at the bottom [data storage]
|
journal
|
March 1992 |
Modelling imaging based on core-loss spectroscopy in scanning transmission electron microscopy
|
journal
|
September 2005 |
Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
|
journal
|
November 2009 |
Dynamics of annular bright field imaging in scanning transmission electron microscopy
|
journal
|
June 2010 |
Direct Imaging of Hydrogen within a Crystalline Environment
|
journal
|
November 2010 |
Modeling Atomic-Resolution Scanning Transmission Electron Microscopy Images
|
journal
|
December 2007 |
Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation
|
journal
|
September 2010 |
Contribution of thermally scattered electrons to atomic resolution elemental maps
|
journal
|
July 2012 |
A New Microscopic Principle
|
journal
|
May 1948 |
Atomic-Resolution Imaging of Spin-State Superlattices in Nanopockets within Cobaltite Thin Films
|
journal
|
March 2011 |
Grundlagen der Elektronenoptik
|
book
|
January 1952 |
The Theory of Electron Diffraction
|
journal
|
February 1953 |
Numerical evaluations of N -beam wave functions in electron scattering by the multi-slice method
|
journal
|
March 1974 |
Three-Dimensional Elemental Mapping at the Atomic Scale in Bimetallic Nanocrystals
|
journal
|
August 2013 |
Crown ethers in graphene
|
journal
|
November 2014 |
Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope
|
journal
|
January 1998 |
A spherical-aberration-corrected 200kV transmission electron microscope
|
journal
|
October 1998 |
Electron microscopy image enhanced
|
journal
|
April 1998 |
Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration
|
journal
|
July 2010 |
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM
|
journal
|
February 2008 |
Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM
|
journal
|
April 2000 |
Anomalous electron absorption effects in metal foils: theory and comparison with experiment
- Hashimoto, H.; Howie, Archibald; Whelan, Michael John
-
Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, Vol. 269, Issue 1336, p. 80-103
https://doi.org/10.1098/rspa.1962.0164
|
journal
|
August 1962 |
The geometrical aberrations of general electron optical systems I The conditions imposed by symmetry
- Hawkins, P. W.
-
Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, Vol. 257, Issue 1086, p. 479-522
https://doi.org/10.1098/rsta.1965.0013
|
journal
|
June 1965 |
Common sessions on microscopy: New techniques and improvements in microscopy (CST)
|
journal
|
November 2001 |
Aberrations
|
book
|
October 2008 |
Aberration correction past and present
|
journal
|
September 2009 |
The correction of electron lens aberrations
|
journal
|
September 2015 |
Attenuation of Fast Electrons in Crystals and Anomalous Transmission
|
journal
|
July 1962 |
Aberration correction for TEM
|
journal
|
December 2004 |
The Magnetic Electron Microscope Objective: Contour Phenomena and the Attainment of High Resolving Power
|
journal
|
January 1947 |
Annular dark-field imaging: Resolution and thickness effects
|
journal
|
February 1993 |
High resolution imaging by 1 MV electron microscopy
|
journal
|
January 1982 |
Development of Cs and Cc correctors for transmission electron microscopy
|
journal
|
February 2013 |
Atomic-precision determination of the reconstruction of a tilt boundary in by aberration corrected HRTEM
|
journal
|
February 2006 |
Inelastic scattering of electrons by crystals. I. The theory of small-angle in elastic scattering
|
journal
|
January 1963 |
Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging
|
journal
|
January 2012 |
The scattering of fast electrons by crystals
|
journal
|
November 1979 |
Absorption parameters in electron diffraction theory
|
journal
|
July 1968 |
Inelastic scattering of fast electrons by crystals: I. Single electron excitations
|
journal
|
July 1969 |
Three-Dimensional Imaging of Individual Dopant Atoms in
|
journal
|
December 2013 |
Quantitative comparison of high resolution TEM images with image simulations
|
journal
|
March 1994 |
Atomic resolution HVEM and environmental noise
|
journal
|
January 1999 |
High resolution electron microscopy of TiO2·7Nb2O5
|
journal
|
May 1973 |
Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy
|
journal
|
February 2011 |
Quantitative Annular Dark Field Electron Microscopy Using Single Electron Signals
|
journal
|
October 2013 |
Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy
|
journal
|
March 2014 |
Direct Observation of Dopant Atom Diffusion in a Bulk Semiconductor Crystal Enhanced by a Large Size Mismatch
|
journal
|
October 2014 |
Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging
|
journal
|
April 2015 |
Coma-free alignment of a high-resolution electron microscope with three-fold astigmatism
|
journal
|
October 1994 |
A new theoretical and practical approach to the multislice method
|
journal
|
September 1977 |
Incoherent Imaging of Thin Specimens Using Coherently Scattered Electrons
|
journal
|
May 1993 |
Incoherent Imaging of Crystals Using Thermally Scattered Electrons
|
journal
|
May 1995 |
Unit-cell scale mapping of ferroelectricity and tetragonality in epitaxial ultrathin ferroelectric films
|
journal
|
December 2006 |
Atom vacancies at a screw dislocation core in SrTiO 3
|
journal
|
November 2006 |
Oxygen octahedron reconstruction in the heterointerfaces investigated using aberration-corrected ultrahigh-resolution transmission electron microscopy
|
journal
|
February 2009 |
Atomic-Resolution Imaging of Oxygen in Perovskite Ceramics
|
journal
|
February 2003 |
Atomic-Scale Analysis of the Oxygen Configuration at a Dislocation Core
|
journal
|
November 2005 |
Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials
|
journal
|
March 2004 |
Canonical Aberration Theory in Electron Optics Up to Ultrahigh-Order Approximation
|
book
|
January 1995 |
Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z-Contrast Electron Microscopy
|
journal
|
October 2014 |
Smart Align—a new tool for robust non-rigid registration of scanning microscope data
|
journal
|
July 2015 |
Diffraction and absorption of inelastically scattered electrons for K -shell ionization
|
journal
|
February 1996 |
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM
|
journal
|
April 2009 |
Visualization of bloch waves of high energy electrons in high resolution electron microscopy
|
journal
|
January 1982 |
Low-loss electron energy loss spectroscopy: An atomic-resolution complement to optical spectroscopies and application to graphene
|
journal
|
September 2015 |
Rapid Measurement of Nanoparticle Thickness Profiles
|
journal
|
January 2013 |
An Assessment of the High-Energy Approximation in the Dynamical Theory of Electron Diffraction
|
journal
|
February 1982 |
Kim et al. reply
|
journal
|
May 2012 |
Interplay of Octahedral Tilts and Polar Order in BiFeO 3 Films
|
journal
|
March 2013 |
Advanced Computing in Electron Microscopy
|
book
|
January 2010 |
Das Elektronenmikroskop
|
journal
|
May 1932 |
Three-fold astigmatism in high-resolution transmission electron microscopy
|
journal
|
October 1994 |
Towards sub-Å electron beams
|
journal
|
June 1999 |
Atomic-Resolution STEM at Low Primary Energies
|
book
|
December 2010 |
Chapter 3 Advances in Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy
|
book
|
January 2008 |
Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
|
journal
|
March 2010 |
Vibrational spectroscopy in the electron microscope
|
journal
|
October 2014 |
Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM
|
journal
|
July 2010 |
Quantitative Atomic Resolution Scanning Transmission Electron Microscopy
|
journal
|
May 2008 |
High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment
|
journal
|
June 2009 |
Standardless Atom Counting in Scanning Transmission Electron Microscopy
|
journal
|
November 2010 |
Experimental quantification of annular dark-field images in scanning transmission electron microscopy
|
journal
|
November 2008 |
Direct visualization of reversible dynamics in a Si6 cluster embedded in a graphene pore
|
journal
|
April 2013 |
Stabilization of graphene nanopore
|
journal
|
May 2014 |
Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy Using Hardware Aberration Correction
|
journal
|
May 2006 |
Carrier Separation at Dislocation Pairs in CdTe
|
journal
|
August 2013 |
Calibration of the operating parameters for an HB5 stem instrument
|
journal
|
January 1986 |
Flexible metallic nanowires with self-adaptive contacts to semiconducting transition-metal dichalcogenide monolayers
|
journal
|
April 2014 |
Exploring the Single Atom Spin State by Electron Spectroscopy
|
journal
|
November 2015 |
Thermal vibrations in convergent-beam electron diffraction
|
journal
|
May 1991 |
Incoherent imaging of zone axis crystals with ADF STEM
|
journal
|
February 1992 |
Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data
|
journal
|
October 2012 |
The Electron Ronchigram
|
book
|
December 2010 |
The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy
|
journal
|
August 2011 |
Aberration measurement using the Ronchigram contrast transfer function
|
journal
|
June 2010 |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy
|
journal
|
February 2014 |
Analytical angular integration of a product of hydrogenic bound-free first Born matrix elements
|
journal
|
June 1983 |
Some Results Obtained by a Newly Constructed Ultra-High-Resolution 1300 kV Electron Microscope
|
journal
|
January 1991 |
Practical methods for the measurement of spatial coherence—A comparative study
|
journal
|
July 2011 |
Bonding Effects in Nitrogen Doped Graphene and Hexagonal Boron Nitride
|
journal
|
July 2010 |
Atomic structure from large-area, low-dose exposures of materials: A new route to circumvent radiation damage
|
journal
|
October 2014 |
A new method for the determination of the wave aberration function for high-resolution TEM.
|
journal
|
May 2004 |
A consistent definition of probe size and spatial resolution in the analytical electron microscope
|
journal
|
September 1987 |
Simulation of thermal diffuse scattering including a detailed phonon dispersion curve
|
journal
|
February 2001 |
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
|
journal
|
February 2008 |
Advancing the Hexapole C s -Corrector for the Scanning Transmission Electron Microscope
|
journal
|
October 2006 |
Origins and historical development of the electron microscope
|
journal
|
May 1962 |
Gabor's Pessimistic 1942 View of Electron Microscopy and How He Stumbled on the Nobel Prize
|
book
|
January 1995 |
Numerical simulation methods for electron and ion optics
|
journal
|
July 2011 |
Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
|
journal
|
January 1997 |
Seeing with electrons
|
journal
|
November 2005 |
Scanning Transmission Electron Microscopy
|
book
|
January 2007 |
Direct Sub-Angstrom Imaging of a Crystal Lattice
|
journal
|
September 2004 |
Confocal operation of a transmission electron microscope with two aberration correctors
|
journal
|
September 2006 |
Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
|
journal
|
August 2008 |
Resolution beyond the 'information limit' in transmission electron microscopy
|
journal
|
April 1995 |
Direct Imaging of the Atomic Configuration of Ultradispersed Catalysts
|
journal
|
October 1996 |
Accurate structure determination from image reconstruction in ADF STEM
|
journal
|
April 1998 |
Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy
|
journal
|
November 1998 |
Incoherent imaging using dynamically scattered coherent electrons
|
journal
|
June 1999 |
The principles and interpretation of annular dark-field Z-contrast imaging
|
book
|
January 2000 |
Beyond the conventional information limit: the relevant coherence function
|
journal
|
May 1994 |
Electronic Excitations in Graphene in the 1–50 eV Range: The π and π + σ Peaks Are Not Plasmons
|
journal
|
June 2014 |
Resolution Quality and Atom Positions in Sub-Ångström Electron Microscopy
|
journal
|
August 2005 |
HRTEM imaging of atoms at sub-Ångström resolution
|
journal
|
June 2005 |
Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy
|
journal
|
July 2009 |
Towards full-structure determination of bimetallic nanoparticles with an aberration-corrected electron microscope
|
journal
|
November 2010 |
Delocalization of the effective interaction for inner-shell ionization in crystals
|
journal
|
February 1998 |
Nonlocality in Imaging
|
journal
|
May 2005 |
Imaging of Light Atoms in the Presence of Heavy Atomic Columns
|
journal
|
July 2010 |
Simulation of Probe Position-Dependent Electron Energy-Loss Fine Structure
|
journal
|
March 2014 |
Image simulation for electron energy loss spectroscopy
|
journal
|
August 2008 |
New Developments of Electron Diffraction Theory
|
book
|
January 1994 |
Spatial Resolution and Information Transfer in Scanning Transmission Electron Microscopy
|
journal
|
January 2008 |
Z-contrast stem for materials science
|
journal
|
June 1989 |
Fulfilling Feynman’s dream: “Make the electron microscope 100 times better”—Are we there yet?
|
journal
|
January 2015 |
Chemically sensitive structure-imaging with a scanning transmission electron microscope
|
journal
|
December 1988 |
Atomic-resolution imaging and spectroscopy of semiconductor interfaces
|
journal
|
November 1993 |
High Angle Dark Field STEM for Advanced Materials
|
journal
|
February 1996 |
Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems
- Pennycook, S. J.; Chisholm, M. F.; Lupini, A. R.
-
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 367, Issue 1903
https://doi.org/10.1098/rsta.2009.0112
|
journal
|
September 2009 |
Misfit accommodation in oxide thin film heterostructures
|
journal
|
May 2013 |
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
|
journal
|
April 2015 |
High-resolution Z-contrast imaging of crystals
|
journal
|
August 1991 |
Atomic resolution Z-contrast imaging of interfaces
|
journal
|
January 1992 |
Microscopy: Hasten high resolution
|
journal
|
November 2014 |
Z-Contrast Scanning Transmission Electron Microscopy
|
book
|
January 1999 |
New high-voltage atomic resolution microscope approaching 1 Å point resolution installed in Stuttgart
|
journal
|
November 1994 |
Tests on the validity of the atomic column approximation for STEM probe propagation
|
journal
|
June 1999 |
Reciprocity in electron diffraction and microscopy
|
journal
|
January 1968 |
Simulation of Spatially Resolved Electron Energy Loss Near-Edge Structure for Scanning Transmission Electron Microscopy
|
journal
|
December 2012 |
Probing the Bonding and Electronic Structure of Single Atom Dopants in Graphene with Electron Energy Loss Spectroscopy
|
journal
|
January 2013 |
XV.On the theory of optical images, with special reference to the microscope
|
journal
|
August 1896 |
Virtual inelastic scattering in high-energy electron diffraction
|
journal
|
January 1978 |
The distribution of intensity in electron diffraction patterns due to phonon scattering
|
journal
|
January 1977 |
Inelastic scattering probabilities in scanning transmission electron microscopy
|
journal
|
November 1988 |
The theory of super-resolution electron microscopy via Wigner-distribution deconvolution
- Rodenburg, J. M.; Bates, R. H. T.
-
Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences, Vol. 339, Issue 1655, p. 521-553
https://doi.org/10.1098/rsta.1992.0050
|
journal
|
June 1992 |
Forty Years of History of a Grating Interferometer
|
journal
|
January 1964 |
Correction of aperture aberrations in magnetic systems with threefold symmetry
|
journal
|
August 1981 |
Hamiltonian magnetic optics
|
journal
|
August 1987 |
Outline of an ultracorrector compensating for all primary chromatic and geometrical aberrations of charged-particle lenses
|
journal
|
February 2004 |
Chapter 1 History of Direct Aberration Correction
|
book
|
January 2008 |
Historical aspects of aberration correction
|
journal
|
March 2009 |
Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation
|
journal
|
November 2014 |
Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector
|
journal
|
June 2007 |
Measurement method of aberration from Ronchigram by autocorrelation function
|
journal
|
October 2008 |
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
|
journal
|
June 2009 |
Correction of higher order geometrical aberration by triple 3-fold astigmatism field
|
journal
|
July 2009 |
Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun
|
journal
|
June 2010 |
Aberration Correctors Developed Under the Triple C Project
|
book
|
January 2011 |
Resolving 45-pm-separated Si–Si atomic columns with an aberration-corrected STEM
|
journal
|
March 2015 |
Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle
|
journal
|
April 2015 |
Evaluation of probe size in STEM imaging at 30 and 60kV
|
journal
|
March 2012 |
Aberration-corrected STEM/TEM imaging at 15 kV
|
journal
|
October 2014 |
A new way of measuring microscope aberrations
|
journal
|
March 2000 |
Diffraction effects in inner‐shell ionization edges
|
journal
|
July 1996 |
Detection of magnetic circular dichroism using a transmission electron microscope
|
journal
|
May 2006 |
�ber einige Fehler von Elektronenlinsen
|
journal
|
September 1936 |
The Theoretical Resolution Limit of the Electron Microscope
|
journal
|
January 1949 |
Electron tomography at 2.4-ångström resolution
|
journal
|
March 2012 |
Ideal lenses and the Scherzer theorem: A supplement
|
journal
|
January 1988 |
Differential phase-contrast microscopy at atomic resolution
|
journal
|
June 2012 |
Annular dark field electron microscope images with better than 2 Å resolution at 100 kV
|
journal
|
December 1989 |
Damped Electron Waves in Crystals
|
journal
|
May 1937 |
The realization of atomic resolution with the electron microscope
|
journal
|
December 1997 |
Development of Aberration-Corrected Electron Microscopy
|
journal
|
January 2008 |
Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope
|
journal
|
January 1982 |
Origin of Anomalous Pt-Pt Distances in the Pt/Alumina Catalytic System
|
journal
|
December 2004 |
On Spectroscopic Resolving Power
|
journal
|
July 1916 |
The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images
|
journal
|
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|
journal
|
December 1951 |
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|
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|
March 2003 |
Deterministic phase retrieval: a Green’s function solution
|
journal
|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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|
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Spectroscopic Imaging of Single Atoms Within a Bulk Solid
|
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|
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|
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|
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|
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|
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|
journal
|
May 1940 |
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|
journal
|
July 1998 |
An optical potential approach to incoherent multiple thermal diffuse scattering in quantitative HRTEM
|
journal
|
July 1998 |
Experimental Evidence for Fluctuating, Chiral-Type Au 55 Clusters by Direct Atomic Imaging
|
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|
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|
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|
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|
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|
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Direct Observation of Atomic Dynamics and Silicon Doping at a Topological Defect in Graphene
|
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|
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Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts
|
journal
|
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Effect of Inelastic Waves on Electron Diffraction
|
journal
|
June 1957 |
Aberration correction in a low voltage SEM by a multipole corrector
- Zach, Joachim; Haider, Maximilian
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 363, Issue 1-2
https://doi.org/10.1016/0168-9002(95)00056-9
|
journal
|
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Graphene Reknits Its Holes
|
journal
|
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Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms
|
journal
|
January 1978 |
Space charge characteristics of an insulating thin film negatively charged by a low-energy electron beam
|
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|
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Single Atom Microscopy
|
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|
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Direct Determination of the Chemical Bonding of Individual Impurities in Graphene
|
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|
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Atomically localized plasmon enhancement in monolayer graphene
|
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|
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Localization of inelastic electron scattering in the low-loss energy regime
|
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|
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Charge Density of MgO: Implications of Precise New Measurements for Theory
|
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|
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